Angle-resolved photoemission spectroscopy (ARPES) is the key momentum-resolved technique for direct probing of the electronic structure of a material. However, since it is highly surface-sensitive, it has been applied to a relatively small set of complex oxides that can be easily cleaved in ultra-high vacuum. Here we describe a new multi-module system at Brookhaven National Laboratory (BNL) in which an oxide molecular beam epitaxy (OMBE) is interconnected with an ARPES and a spectroscopic-imaging scanning tunneling microscopy (SI-STM) module. This new capability largely expands the range of complex-oxide materials and artificial heterostructures accessible to these two most powerful and complementary techniques for studies of electronic structure of materials. We also present the first experimental results obtained using this system — the ARPES studies of electronic band structure of a La_2-xSr_xCuO₄ (LSCO) thin film grown by OMBE.

角分辨光电子能谱 (ARPES) 是直接探测材料电子结构的关键动量分辨技术。然而，由于它对表面高度敏感，它已被应用于相对较小的一组复杂氧化物，这些氧化物可以在超高真空中轻松裂解。在这里，我们描述了布鲁克海文国家实验室 (BNL) 的一种新的多模块系统，其中氧化物分子束外延 (OMBE) 与 ARPES 和光谱成像扫描隧道显微镜 (SI-STM) 模块相互连接。这种新功能极大地扩展了复合氧化物材料和人工异质结构的范围，这两种最强大和互补的技术可用于研究材料的电子结构。_{OMBE 生长的2-x} Sr _x CuO ₄ (LSCO) 薄膜。