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Entire Domain Basis Function Expansion of the Differential Surface Admittance for Efficient Broadband Characterization of Lossy Interconnects
IEEE Transactions on Microwave Theory and Techniques ( IF 4.3 ) Pub Date : 2020-04-01 , DOI: 10.1109/tmtt.2019.2957485
Martijn Huynen , Kamil Yavuz Kapusuz , Xiao Sun , Geert Van der Plas , Eric Beyne , Daniel De Zutter , Dries Vande Ginste

This article presents a full-wave method to characterize lossy conductors in an interconnect setting. To this end, a novel and accurate differential surface admittance operator for cuboids based on entire domain basis functions is formulated. By combining this new operator with the augmented electric field integral equation, a comprehensive broadband characterization is obtained. Compared with the state of the art in differential surface admittance operator modeling, we prove the accuracy and improved speed of the novel formulation. Additional examples support these conclusions by comparing the results with commerical software tools and with measurements.

中文翻译:

差分表面导纳的全域基函数扩展,用于有损互连的有效宽带表征

本文介绍了一种表征互连设置中的有损导体的全波方法。为此,基于整个域基函数制定了一种新颖且准确的长方体微分表面导纳算子。通过将这个新算子与增强电场积分方程相结合,可以获得全面的宽带表征。与微分表面导纳算子建模的最新技术相比,我们证明了新公式的准确性和提高的速度。其他示例通过将结果与商业软件工具和测量结果进行比较来支持这些结论。
更新日期:2020-04-01
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