Abstract In this work we used the ferromagnetic resonance (FMR) technique to measure the contributions for the magnetic relaxation in Y3Fe5O12 textured films deposited onto (001) Gd3Ga5O12 by magnetron sputtering. Through the numerical fitting of the angular dependence of the in-plane FMR linewidth measurements we identified the contribution of the Gilbert, two-magnon and mosaicity relaxation mechanisms. Regarding to the line broadening due to two-magnon mechanism, we interpreted it as a result of rectangular defects distributed over the film plane. The overall defects were decomposed into three crystallography direction chosen according to the in-plane FMR resonance field experimental results. We observed the two-magnon scattering rate being relevant for YIG thickness below 150 nm. Although it is also present for thicker samples, the Gilbert mechanism dominates with mosaicity being very important to corroborate the shape of the angular dependence, but with small amplitude. We point out the relevance of our finding regarding two-magnon scattering effect in YIG thin films, directly impacting in an overestimation of the spin pumping contribution to the FMR line broadening in YIG/ heavy-metal systems.

中文翻译：

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使用铁磁谐振过滤 YIG(001) 薄膜的磁弛豫机制

摘要 在这项工作中，我们使用铁磁共振 (FMR) 技术来测量通过磁控溅射沉积在 (001) Gd3Ga5O12 上的 Y3Fe5O12 织构薄膜中磁弛豫的贡献。通过平面内 FMR 线宽测量的角度依赖性的数值拟合，我们确定了吉尔伯特、两磁振子和镶嵌松弛机制的贡献。关于由于双磁振子机制引起的线加宽，我们将其解释为分布在薄膜平面上的矩形缺陷的结果。根据面内 FMR 共振场实验结果，将整体缺陷分解为三个晶体学方向。我们观察到双磁振子散射率与低于 150 nm 的 YIG 厚度相关。虽然它也存在于较厚的样品中，吉尔伯特机制占主导地位，镶嵌性对于证实角度依赖性的形状非常重要，但幅度很小。我们指出了我们关于 YIG 薄膜中双磁振子散射效应的发现的相关性，直接影响了对 YIG/重金属系统中 FMR 线加宽的自旋泵浦贡献的高估。