Spark plasma sintering (SPS) was applied to prepare textured Bi_1.9Gd_0.1Te₃ compounds with various grain structures, tuned by changing in the sintering temperature. The grains forming ordered lamellar structure under texturing are elongated in plane oriented perpendicularly to SPS-pressing direction. As result, average grain size measured parallel to this direction and corresponding to fine-grained samples happened to be much less as compared to relevant size for perpendicular direction characteristic for coarse-grained samples. Anisotropy in electrical resistivity inherent for single crystal was found to be partially recovered in textured samples, i.e. resistivity measured along directions parallel or perpendicular to SPS-pressuring direction is different. Moreover, resistivity for both directions is increasing with decreasing in grain size or with decreasing in intergrain distance. Grain size effect on resistivity due to grain boundary scattering of electrons was found to be anisotropic, since the effect is observed for different ranges of change in average grain sizes.

应用火花等离子体烧结（SPS）制备织构化的Bi _1.9 Gd _0.1 Te ₃通过改变烧结温度来调节具有各种晶粒结构的复合材料。在纹理作用下形成有序层状结构的晶粒在垂直于SPS压制方向的平面内拉长。结果，与粗颗粒样品的垂直方向特征的相关尺寸相比，平行于该方向测得并对应于细颗粒样品的平均晶粒尺寸恰好小得多。发现单晶固有的电阻率各向异性在织构样品中部分恢复，即沿平行或垂直于SPS加压方向的方向测得的电阻率不同。而且，两个方向的电阻率都随着晶粒尺寸的减小或晶粒间距离的减小而增加。