We report the application of focused probe ptychography using binary 4D datasets obtained using scanning transmission electron microscopy (STEM). Modern fast pixelated detectors have enabled imaging of individual convergent beam electron diffraction patterns in a STEM raster scan at frame rates in the range of 1000–8000 Hz using conventional counting modes. Changing the bit depth of a counting detector, such that only values of 0 or 1 can be recorded at each pixel, allows one to decrease the dwell time and increase the frame rate to 12.5 kHz, reducing the electron exposure of the sample for a given beam current. Atomically resolved phase contrast of an aluminosilicate zeolite (ZSM-5) is observed from sparse diffraction patterns with isolated individual electrons, demonstrating the potential of binary ptychography as a low-dose 4D STEM technique.

中文翻译：

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使用快速二进制 4D STEM 数据进行相位重建

我们报告了使用扫描透射电子显微镜 (STEM) 获得的二进制 4D 数据集的聚焦探针 ptychography 的应用。现代快速像素化探测器已经能够使用传统计数模式以 1000-8000 Hz 范围内的帧速率在 STEM 光栅扫描中对单个会聚束电子衍射图案进行成像。改变计数检测器的位深度，使得每个像素只能记录 0 或 1 的值，允许减少驻留时间并将帧速率增加到 12.5 kHz，减少给定样品的电子暴露束流。从具有孤立单个电子的稀疏衍射图案中观察到铝硅酸盐沸石 (ZSM-5) 的原子分辨相衬，证明了二元 ptychography 作为低剂量 4D STEM 技术的潜力。