Abstract Yttrium iron garnet (YIG) nanoparticles (NPs) doped with rare earth (RE) metal ions (Y2.5Sm0.5Fe5O12, Y2.5Nd0.5Fe5O12) were successfully synthesized by sol-gel auto combustion approach. The cubic crystalline structure and morphology of the prepared garnet ferrite NPs were analyzed by X-ray diffractometer (XRD) and field emission scanning electron microscopy (FESEM). The cubic crystalline garnet phase of the synthesized YIG, Sm-YIG and Nd-YIG samples was successfully achieved at 950 °C sintering temperature. The force constant and absorption bands were estimated by using Fourier transform infrared spectroscopy (FTIR). The doping effect of RE metal ions on the chemical states of YIG were examined by x-ray photoelectron microscopy (XPS). The valence band (from 12.63 eV to 13.22 eV), conduction band (from 10.89 eV to 11.34 eV) edges and optical bandgap values of RE doped YIG samples were calculated using UV–Vis spectroscopy and ultraviolet photo electron spectroscopy (UPS). The magnetic analysis of the prepared NPs was studied using vibrating sample magnetometer (VSM). The XPS analysis of RE doped YIG samples exhibit the existence of RE (Sm+3, Nd+3) contents on the surface of YIG ferrite by decreasing the oxygen lattice in garnet structure. The optical bandgap (from 1.74 eV to 1.88 eV) explains the semiconducting nature of the synthesized NPs. The UPS results confirm the valence band position of YIG doped samples. The saturation magnetization and remanence of RE doped garnet ferrite samples increased from 13.45 to 18.83 emu/g and 4.06–6.53 emu/g, respectively.

中文翻译：

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稀土 (Sm+3, Nd+3) 掺杂石榴石铁氧体纳米粒子 (NPs) 的磁特性和光带排列

摘要 采用溶胶-凝胶自燃法成功合成了掺杂稀土（RE）金属离子（Y2.5Sm0.5Fe5O12、Y2.5Nd0.5Fe5O12）的钇铁石榴石（YIG）纳米颗粒（NPs）。通过X射线衍射仪（XRD）和场发射扫描电子显微镜（FESEM）分析制备的石榴石铁氧体纳米颗粒的立方晶体结构和形貌。合成的 YIG、Sm-YIG 和 Nd-YIG 样品的立方晶体石榴石相在 950 °C 的烧结温度下成功实现。通过使用傅里叶变换红外光谱（FTIR）估计力常数和吸收带。通过 X 射线光电子显微镜 (XPS) 检查稀土金属离子对 YIG 化学状态的掺杂影响。价带（从 12.63 eV 到 13.22 eV），导带（从 10.89 eV 到 11。使用 UV-Vis 光谱和紫外光电子光谱 (UPS) 计算 RE 掺杂的 YIG 样品的 34 eV) 边缘和光学带隙值。使用振动样品磁强计 (VSM) 研究了制备的 NPs 的磁性分析。RE掺杂的YIG样品的XPS分析表明，通过减少石榴石结构中的氧晶格，YIG铁氧体表面存在RE（Sm+3，Nd+3）含量。光学带隙（从 1.74 eV 到 1.88 eV）解释了合成 NP 的半导体性质。UPS 结果证实了 YIG 掺杂样品的价带位置。RE掺杂石榴石铁氧体样品的饱和磁化强度和剩磁分别从13.45增加到18.83 emu/g和4.06-6.53 emu/g。