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Reduction of Beam Squinting and Cross-Polarized Fields in a Wideband CP Element
IEEE Antennas and Wireless Propagation Letters ( IF 3.7 ) Pub Date : 2020-03-01 , DOI: 10.1109/lawp.2020.2968406
B. Pavan Kumar , Debatosh Guha , Chandrakanta Kumar

Achieving wide circularly polarized (CP) bandwidth in a simple probe-fed microstrip antenna is essential for many practical applications. Existing knowledge guides exploring a thick substrate-based patch design. However, it suffers from two major inherent issues: squinting of beam and high cross-polarized (XP) radiation. No solution is available so far. This letter successfully addresses both issues by imposing restriction on the fringing characteristics as well as modal fields of a suspended substrate circular patch. Engineered ground plane bearing different strategic defects has been explored leading to about 50% correction in beam squinting with reference to antenna boresight and 2–8 dB reduction in a peak XP level. Realistic design, physical insight, and the experimental validation ensure its huge potential for practical applications.

中文翻译:

减少宽带 CP 元件中的光束偏斜和交叉偏振场

在简单的探针馈电微带天线中实现宽圆极化 (CP) 带宽对于许多实际应用至关重要。现有知识指南探索基于厚基板的贴片设计。然而,它存在两个主要的固有问题:光束斜视和高交叉极化 (XP) 辐射。到目前为止还没有可用的解决方案。这封信通过对悬浮基板圆形贴片的边缘特性和模态场施加限制,成功地解决了这两个问题。已经探索了具有不同战略缺陷的工程接地平面,导致参考天线视轴的波束斜视校正约 50%,峰值 XP 水平降低 2-8 dB。现实的设计、物理洞察力和实验验证确保了其在实际应用中的巨大潜力。
更新日期:2020-03-01
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