Excessive switching activity in the fault-free circuit can cause a fault-free circuit to fail because of increased delays. For the same reason, excessive switching activity in a faulty circuit can cause a delay fault to escape detection. This paper observes that the switching activity is higher in the presence of multiple delay faults with higher multiplicities (larger numbers of single faults that are present in the circuit together). The challenge in addressing multiple faults is related to their large number. This paper addresses this challenge by an iterative procedure that is applied to transition faults under a low-power broadside test set, and has two subprocedures: 1) the first subprocedure finds multiple transition faults with excessive faulty switching activity and 2) the second subprocedure modifies the test set so as to avoid excessive faulty switching activity for the faults found by the first subprocedure. With every additional iteration there are fewer multiple transition faults that exhibit excessive faulty switching activity. The experimental results for benchmark circuits demonstrate the levels of excessive faulty switching activity in the presence of multiple transition faults, and the possibility of reducing or even eliminating it after a small number of iterations.

中文翻译：

---

存在多个转换故障时故障电路的开关活动

由于延迟增加，无故障电路中的过度开关活动会导致无故障电路发生故障。出于同样的原因，故障电路中的过度开关活动会导致延迟故障以逃避检测。本文观察到，在存在具有更高多重性的多个延迟故障（电路中同时存在大量单个故障）时，开关活动更高。解决多个故障的挑战与其数量众多有关。本文通过一个迭代过程来解决这一挑战，该过程应用于低功率宽边测试集下的转换故障，并且有两个子过程：1) 第一个子过程发现多个转换故障，切换活动有过多的错误； 2) 第二个子过程修改测试集，以避免第一个子过程发现的故障有过多的错误切换活动。随着每一次额外的迭代，表现出过多故障切换活动的多重转换故障就会减少。基准电路的实验结果证明了在存在多个转换故障的情况下过度故障切换活动的水平，以及在少量迭代后减少甚至消除它的可能性。