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Copper-Plating Metallization With Alternative Seed Layers for c-Si Solar Cells Embedding Carrier-Selective Passivating Contacts
IEEE Journal of Photovoltaics ( IF 2.5 ) Pub Date : 2020-03-01 , DOI: 10.1109/jphotov.2019.2957671
Gianluca Limodio , Yvar De Groot , Gerwin Van Kuler , Luana Mazzarella , Yifeng Zhao , Paul Procel , Guangtao Yang , Olindo Isabella , Miro Zeman

In this article, we develop in parallel two fabrication methods for copper (Cu) electroplated contacts suitable for either silicon nitride or transparent conductive oxide antireflective coatings. We employ alternative seed layers, such as evaporated Ag or Ti, and optimize the Ti–Cu or Ag–Cu contacts with respect to uniformity of plating and aspect ratio of the final plated grid. Moreover, we test plating/deplating sequence instead of a direct current plating or the SiO2 layer approach to solve undesired plating outside the designed contact openings. The main objective of this paper is to explore the physical limit of this contact formation technology keeping the process compatible with industrial needs. In addition, we employ the optimized Cu-plating contacts in three different front/back-contacted crystalline silicon solar cells architectures: 1) silicon heterojunction solar cell with hydrogenated nanocrystalline silicon oxide as doped layers, 2) thin SiO2/doped poly-Si-poly-Si solar cell, and 3) hybrid solar cell endowed with rear thin SiO2/poly-Si contact and front heterojunction contact. To investigate the metallization quality, we compare fabricated devices to reference ones obtained with standard front metallization (Ag screen printing and Al evaporation). We observe a relatively small drop in VOC by 5 to 10 mV by using Cu-plating front grid, whereas fill factor was improved for solar cells with Cu-plated front contact if compared with evaporated Al.

中文翻译:

具有替代种子层的镀铜金属化用于嵌入载流子选择性钝化触点的 c-Si 太阳能电池

在本文中,我们同时开发了两种适用于氮化硅或透明导电氧化物抗反射涂层的铜 (Cu) 电镀触点制造方法。我们采用替代种子层,例如蒸发的 Ag 或 Ti,并根据电镀的均匀性和最终电镀网格的纵横比优化 Ti-Cu 或 Ag-Cu 接触。此外,我们测试电镀/去电镀序列,而不是直流电镀或 SiO2 层方法,以解决设计接触开口外的不希望电镀。本文的主要目的是探索这种接触形成技术的物理限制,使该过程与工业需求兼容。此外,我们在三种不同的正面/背面接触晶体硅太阳能电池架构中采用了优化的镀铜触点:1) 以氢化纳米晶氧化硅作为掺杂层的硅异质结太阳能电池,2) 薄 SiO2/掺杂多晶硅多晶硅太阳能电池,以及 3) 具有背面薄 SiO2/多晶硅接触和正面异质结的混合太阳能电池接触。为了研究金属化质量,我们将制造的器件与通过标准正面金属化(Ag 丝网印刷和 Al 蒸发)获得的参考器件进行比较。通过使用镀铜前栅,我们观察到 VOC 相对较小的下降 5 到 10 mV,而与蒸发的铝相比,具有镀铜前接触的太阳能电池的填充因子得到了改善。和 3) 具有背面薄 SiO2/poly-Si 触点和正面异质结触点的混合太阳能电池。为了研究金属化质量,我们将制造的器件与通过标准正面金属化(Ag 丝网印刷和 Al 蒸发)获得的参考器件进行比较。通过使用镀铜前栅,我们观察到 VOC 相对较小的下降 5 到 10 mV,而与蒸发的铝相比,具有镀铜前接触的太阳能电池的填充因子得到了改善。和 3) 具有背面薄 SiO2/poly-Si 触点和正面异质结触点的混合太阳能电池。为了研究金属化质量,我们将制造的器件与通过标准正面金属化(Ag 丝网印刷和 Al 蒸发)获得的参考器件进行比较。通过使用镀铜前栅,我们观察到 VOC 相对较小的下降 5 到 10 mV,而与蒸发的铝相比,具有镀铜前接触的太阳能电池的填充因子得到了改善。
更新日期:2020-03-01
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