XRF procedure to determine the mass absorption coefficient in Cr/Co two-layer systems has been proposed. The procedure uses easy-to-make thin-fi lm layers of sputtered chromium on a polymer fi lm substrate. Correction coefficients have been calculated that take into account the absorption of primary radiation of the X-ray tube and the absorption intensities of the analytical lines of a lower layer element in an upper layer.

中文翻译：

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X射线荧光法测定两层Cr / Co薄膜系统的质量吸收系数

已经提出了用于确定Cr / Co两层系统中质量吸收系数的XRF程序。该程序在聚合物膜基材上使用易于制作的溅射铬薄膜层。已经计算出校正系数，该校正系数考虑了X射线管的一次辐射的吸收和上层中下层元素的分析线的吸收强度。