CeO₂–based thin films are prepared by spray-pyrolysis deposition from different aqueous precursor solutions containing nitrate, chloride or acetate salts. The morphology and orientation growth strongly depends on the precursor type. Acetate solutions lead to dense films with improved microstructural features, i.e. uniform film thickness and a low roughness of 1.5 nm. Films with different Gd-content (Ce_1-xGd_xO_2-x/2, 0 ≤ x ≤ 0.2, CGO) are prepared from acetate salts. These films show a (200) preferred orientation growth, regardless of the substrate type, i.e. fused quartz and polycrystalline ceramics. The in-plane conductivity of the films on quartz is lower than that of the bulk material, possibly due to the different thermal mismatch between the substrate and the film. These CGO films are also evaluated as protective layers to prevent the reaction between the Zr_0.84Y_0.16O_1.92 (YSZ) electrolyte and the La_0.6Sr_0.4Co_0.2Fe_0.8O_3-δ (LSCF) cathode. The electrode efficiency of LCSF improves greatly after the introduction of a 150 nm thin CGO interlayer.

基于CeO ₂的薄膜是通过喷雾热解沉积法从含有硝酸盐，氯化物或乙酸盐的不同水溶液前体溶液中制备的。形态和取向的增长在很大程度上取决于前驱体的类型。乙酸盐溶液导致具有改善的微结构特征的致密膜，即均匀的膜厚度和1.5 nm的低粗糙度。Gd含量不同的薄膜（Ce _1-x Gd _x O _{2-x / 2}（0≤x≤0.2，CGO）由乙酸盐制备。这些膜表现出（200）较好的取向生长，而与基材类型（即熔融石英和多晶陶瓷）无关。石英上的薄膜的面内电导率低于块状材料的面内电导率，这可能是由于基板和薄膜之间的热失配不同所致。这些CGO膜还被评估为保护层，以防止Zr _0.84 Y _0.16 O _1.92（YSZ）电解质与La _0.6 Sr _0.4 Co _0.2 Fe _0.8 O _{3-之间的反应}δ（LSCF）阴极。引入150 nm薄CGO中间层后，LCSF的电极效率大大提高。