Abstract A versatile low-cost experimental set-up and adjoining measurement protocol for continuous temperature dependent electrical measurements in the temperature range of 100 K – 500 K is described. The set-up can perform continuous measurements of DC and AC electrical properties of a sample under test (SUT) as a function of its temperature in the mentioned temperature range without any artefacts. The SUT can be in the form of film, or, powders pressed into pellets. The set-up comprises of automatic data acquisition system equipped with LabVIEW programme for real time data acquisition during measurements. The errors involved in the measurements using the set-up have been calculated by measuring the temperature dependent resistance of standard Pt100 RTD temperature sensor and from temperature response of dielectric constant of standard polycrystalline BaTiO3. The high measurement accuracy of the present set-up in artefact-free AC and DC electrical measurements has been demonstrated by measuring the temperature response of the electrical properties of standard polycrystalline BaTiO3, standard polycrystalline SnO2 and nano polycrystalline SnO2 samples.

中文翻译：

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用于 100 K – 500 K 温度范围内温度相关电气测量的多功能低成本实验装置和测量协议

摘要描述了一种用于 100 K – 500 K 温度范围内连续温度相关电气测量的多功能低成本实验装置和相邻测量协议。该装置可以连续测量被测样品 (SUT) 的直流和交流电特性，作为其在上述温度范围内的温度的函数，而不会产生任何人工制品。SUT 可以是薄膜的形式，也可以是压成颗粒的粉末。该设置包括配备LabVIEW程序的自动数据采集系统，用于在测量过程中实时采集数据。通过测量标准 Pt100 RTD 温度传感器的温度相关电阻和标准多晶 BaTiO3 的介电常数的温度响应，计算了使用该装置进行测量所涉及的误差。通过测量标准多晶 BaTiO3、标准多晶 SnO2 和纳米多晶 SnO2 样品的电学特性的温度响应，证明了本装置在无伪影交流和直流电测量中的高测量精度。