Amplitude–wavelength (AW) maps or “Stedman diagrams” are often used to provide a graphical representation of the limitations and capabilities of surface measuring instruments. This paper presents an approach for setting the parameter constraints of X-ray computed tomography (CT) in terms of resolution and measuring range for the purpose of representing the performance of industrial CT systems on an AW map. Such AW map will allow instrument users to quickly compare the CT instrument performance to other measuring systems. Examples of the construction of AW maps for different working capabilities of X-ray CT systems, and based on experimental data, are provided. Polypropylene, aluminum, and steel are three workpiece materials considered for determining some of the limitations of measuring capability for the maps developed in this paper. Although the limiting boundaries of the AW plots presented in this paper set a generalized measure of performance for comparisons with other measuring instruments, they may evolve with more comprehensive models of the limiting factors in X-ray CT.

振幅-波长（AW）图或“ Stedman图”通常用于提供表面测量仪器的局限性和功能的图形表示。本文提出了一种在分辨率和测量范围方面设置X射线计算机断层扫描（CT）的参数约束的方法，目的是在AW地图上表示工业CT系统的性能。这样的AW图将使仪器用户能够快速将CT仪器的性能与其他测量系统进行比较。提供了针对X射线CT系统的不同工作能力并基于实验数据构建AW映射的示例。聚丙烯，铝和钢是用于确定本文开发的地图的测量能力的某些局限性的三种工件材料。