This paper introduces a procedure aimed to quantitatively measure the optical properties of nanoparticles, namely the complex polarizability and the extinction, scattering, and absorption cross sections, simultaneously. The method is based on the processing of intensity and wavefront images of a light beam illuminating the nanoparticle of interest. Intensity and wavefront measurements are carried out using quadriwave lateral shearing interferometry, a quantitative phase imaging technique with high spatial resolution and sensitivity. The method does not require any preknowledge on the particle and involves a single interferogram image acquisition. The full determination of the actual optical properties of nanoparticles is of particular interest in plasmonics and nanophotonics for the active search and characterization of new materials, e.g., aimed to replace noble metals in future applications of nanoplasmonics with less-lossy or refractory materials.

中文翻译：

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使用定量相成像对单个纳米颗粒进行全光学表征

本文介绍了一种旨在定量测量纳米粒子光学特性的程序，即同时测量复极化率和消光，散射和吸收截面。该方法基于照亮感兴趣的纳米粒子的光束的强度和波前图像的处理。强度和波前测量使用四波横向剪切干涉仪进行，这是一种具有高空间分辨率和灵敏度的定量相位成像技术。该方法不需要对粒子有任何预知，并且涉及单个干涉图图像采集。纳米粒子的实际光学性质的完全确定在等离子体和纳米光子学中尤为重要，可用于主动搜索和表征新材料，例如