This letter studies the photocharge-modulated passive intermodulation (PIM) effect on the Ag2O/Ag contact junction. It is demonstrated that the photocharge with the parasitic parameters on the contact junction can modulate the electron transport process and make the PIM components changed with photoillumination. The linear RC constant can change the nonlinear current strength, under the periodical photostimulation, and PIM components will vary with the photopulses. In the experiment, by using a specially designed coaxial fixture to measure the PIM response with RC components on the contact junction, a semianalytical model for this photoeffect-modulated contact PIM is demonstrated.

中文翻译：

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高功率微波器件中 Ag2O/Ag 结的光电荷调制无源互调

这封信研究了光电荷调制的无源互调 (PIM) 对 Ag2O/Ag 接触结的影响。结果表明，接触结上具有寄生参数的光电荷可以调节电子传输过程并使PIM分量随光照射而变化。线性RC常数可以改变非线性电流强度，在周期性光刺激下，PIM分量会随着光脉冲的变化而变化。在实验中，通过使用专门设计的同轴夹具测量接触结上的 RC 元件的 PIM 响应，展示了这种光效应调制接触 PIM 的半解析模型。