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Photocharge-Modulated Passive Intermodulation on Ag₂O/Ag Junction in High-Power Microwave Devices
IEEE Microwave and Wireless Components Letters ( IF 2.374 ) Pub Date : 2020-02-18 , DOI: 10.1109/lmwc.2020.2971829
Xiong Chen; Yongning He; David J. Pommerenke; Jun Fan

This letter studies the photocharge-modulated passive intermodulation (PIM) effect on the Ag 2 O/Ag contact junction. It is demonstrated that the photocharge with the parasitic parameters on the contact junction can modulate the electron transport process and make the PIM components changed with photoillumination. The linear RC constant can change the nonlinear current strength, under the periodical photostimulation, and PIM components will vary with the photopulses. In the experiment, by using a specially designed coaxial fixture to measure the PIM response with RC components on the contact junction, a semianalytical model for this photoeffect-modulated contact PIM is demonstrated.
更新日期:2020-03-16

 

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