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The design and implementation of a robust single-layer QCA ALU using a novel fault-tolerant three-input majority gate
The Journal of Supercomputing ( IF 2.5 ) Pub Date : 2020-03-14 , DOI: 10.1007/s11227-020-03249-3
Seyed-Sajad Ahmadpour , Mohammad Mosleh , Saeed Rasouli Heikalabad

Inverter and majority gates are considered as two important primitive gates for designing logical circuits in the quantum-dot cellular automata (QCA) technology. Up to now, many QCA layouts have been introduced for three-input majority gates, most of which are not robust against the QCA defects and so they are prone to faults. In this paper, we propose an efficient fault-tolerant 3-input majority gate with ten simple and rotated cells whose output signal strength is very high (± 9.93e−001). The fault tolerance of the proposed structure is investigated against cell omission, extra-cell deposition, and displacement defects. The results show that the proposed structure is 100% and 90% tolerant against single-cell omission and extra-cell deposition defects. Moreover, the error probability of the proposed gate under cell omission and extra-cell deposition defects is investigated through analytical modeling. Using the proposed fault-tolerant structure, two basic circuits including a fault-tolerant QCA full-adder and a fault-tolerant 2:1 QCA multiplexer are introduced. Finally, using the proposed circuits, a fault-tolerant one-bit arithmetic logic unit with four mathematical and logical operations is designed and implemented. To verify the proposed three-input majority gate, some physical proofs are provided. The results of simulations by QCADesigner 2.0.3 show that the proposed circuits work well. The power analysis of the proposed structure is performed using a QCAPro tool. The comparison results show that the proposed circuits are much better than the previous designs.

中文翻译:

使用新型容错三输入多数门设计和实现稳健的单层 QCA ALU

逆变器和多数门被认为是量子点元胞自动机 (QCA) 技术中设计逻辑电路的两个重要的原始门。到目前为止,已经为三输入多数门引入了许多 QCA 布局,其中大多数对 QCA 缺陷不具有鲁棒性,因此它们容易出现故障。在本文中,我们提出了一种高效的容错 3 输入多数门,具有十个简单且旋转的单元,其输出信号强度非常高 (± 9.93e-001)。针对电池遗漏、电池外沉积和位移缺陷,研究了所提出结构的容错性。结果表明,所提出的结构对单电池遗漏和电池外沉积缺陷具有 100% 和 90% 的耐受性。而且,通过分析建模研究了在单元遗漏和单元外沉积缺陷下所提出的栅极的错误概率。使用所提出的容错结构,介绍了两个基本电路,包括容错 QCA 全加器和容错 2:1 QCA 多路复用器。最后,使用所提出的电路,设计并实现了具有四个数学和逻辑运算的容错一位算术逻辑单元。为了验证所提出的三输入多数门,提供了一些物理证明。QCADesigner 2.0.3 的仿真结果表明,所提出的电路工作良好。建议结构的功率分析是使用 QCAPro 工具进行的。比较结果表明,所提出的电路比以前的设计要好得多。
更新日期:2020-03-14
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