The present review paper focuses on direct measurements of oscillatory forces. Beside the surface forces apparatus (SFA), atomic force microscopy (AFM) has emerged as the most commonly used technique to measure surface forces. Recent instrumental advances of both methods are highlighted in the review. Different systems, showing oscillatory forces are classified. Principle distinction is made between 1-component liquids (water, organic liquids and liquid crystals), pseudo 1-component liquids (ionic liquids and microemulsions) and 2-component liquids (dispersions containing polyelectrolytes, micelles or nanoparticles). In the last few years the oscillatory force studies address particle characterisation, synergistic effects in multi-component systems, the introduction of ’switchable’ forces, and resolving liquid properties under confinement. Last not least, the ability of AFM and SFA to measure oscillatory forces is discussed.

本文的重点是对振荡力的直接测量。除了表面力设备（SFA）之外，原子力显微镜（AFM）已经成为测量表面力的最常用技术。审查中重点介绍了这两种方法的最新工具进展。显示振荡力的不同系统被分类。在1组分液体（水，有机液体和液晶），伪1组分液体（离子液体和微乳液）和2组分液体（包含聚电解质，胶束或纳米颗粒的分散液）之间进行原理区分。在过去的几年中，振荡力研究涉及颗粒表征，多组分系统中的协同效应，“可转换”力的引入以及在受限条件下解析液体性质。