Belok/XSA Diffraction Beamline for Studying Crystalline Samples at Kurchatov Synchrotron Radiation Source,Crystal Research and Technology

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Belok/XSA Diffraction Beamline for Studying Crystalline Samples at Kurchatov Synchrotron Radiation Source
Crystal Research and Technology ( IF 1.5 ) Pub Date : 2020-03-12 , DOI: 10.1002/crat.201900184
Roman D. Svetogorov ₁ , Pavel V. Dorovatovskii ₁ , Vladimir A. Lazarenko ₁

Affiliation

Introduction of “Belok/XSA” beamline‐modernization is presented here with commissioning of a modern synchrotron beamline with unique capabilities for the structural analysis of single and polycrystalline samples. The beamline is designed to perform important tasks in modern crystallography, such as solving and refining the atomic structure using the single‐ and polycrystal method, studying the real (defective) structure, and analyzing the distribution of electron density in crystals, it is also possible to study rapidly occurring processes, for example, temperature phase transitions. Due to the speed of data accumulation and a registration over a large solid angle, the method allows to study large numbers of samples. This beamline has become extremely demanded in the chemical, biological, material science, and archaeological community in Russia.

中文翻译：

Belok / XSA衍射光束线用于研究库尔恰托夫同步辐射源的晶体样品

本文介绍了“ Belok / XSA”光束线的现代化，同时介绍了一种现代同步加速器光束线，该光束具有独特的功能，可用于单晶和多晶样品的结构分析。光束线旨在执行现代晶体学中的重要任务，例如使用单晶和多晶方法求解和改善原子结构，研究真实（缺陷）结构以及分析晶体中电子密度的分布，这也是可能的研究快速发生的过程，例如温度相变。由于数据积累的速度和在大立体角上的配准，该方法可以研究大量样本。在俄罗斯的化学，生物，材料科学和考古界，对这种束线的需求已变得极为迫切。

更新日期：2020-03-12

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