Noninvasive Near‐Field Spectroscopy of Single Subwavelength Complementary Resonators,Laser & Photonics Reviews

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Noninvasive Near‐Field Spectroscopy of Single Subwavelength Complementary Resonators
Laser & Photonics Reviews ( IF 9.8 ) Pub Date : 2020-03-05 , DOI: 10.1002/lpor.201900254
Lucy L. Hale ₁ , Janine Keller ₂ , Thomas Siday ₁ , Rodolfo I. Hermans ₁ , Johannes Haase ₃ , John L. Reno ₄ , Igal Brener ₄ , Giacomo Scalari ₂ , Jérôme Faist ₂ , Oleg Mitrofanov _{1,

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Affiliation

Subwavelength metallic resonators provide a route to achieving strong light–matter coupling by means of tight confinement of resonant electromagnetic fields. Investigation of such resonators however often presents experimental difficulties, particularly at terahertz (THz) frequencies. A single subwavelength resonator interacts weakly with THz beams, making it difficult to probe it using far‐field methods, whereas arrays of resonators exhibit inter‐resonator coupling, which affect the resonator spectral signature and field confinement. Here, traditional far‐field THz spectroscopy is systematically compared with aperture‐type THz near‐field microscopy for investigating complementary THz resonators. While the far‐field method proves impractical for measuring single resonators, the near‐field technique gives high signal‐to‐noise spectral information, only achievable in the far‐field with resonator arrays. At the same time, the near‐field technique allows to analyze single resonators without significant interaction with the near‐field probe. Furthermore, the near‐field technique allows highly confined fields and surface waves to be mapped in space and time. This information gives invaluable insight into spectral response in resonator arrays. This near‐field microscopy and spectroscopy method enables investigations of strong light–matter coupling at THz frequencies in the single‐resonator regime.

中文翻译：

单个亚波长互补谐振器的无创近场光谱

亚波长金属谐振器通过严格限制谐振电磁场，提供了实现强光耦合的途径。然而，对这种谐振器的研究通常会带来实验上的困难，特别是在太赫兹（THz）频率下。单个亚波长谐振器与THz光束相互作用较弱，因此难以使用远场方法对其进行探测，而谐振器阵列则表现出谐振器间耦合，从而影响谐振器的频谱特征和场约束。在这里，系统地将传统的远场太赫兹光谱与孔径型太赫兹近场显微镜进行了比较，以研究互补太赫兹谐振器。虽然远场方法不适合用于测量单个谐振器，但近场技术可提供高信噪比的频谱信息，只有在谐振器阵列的远场才能实现。同时，近场技术可以分析单个谐振器，而无需与近场探头发生明显的相互作用。此外，近场技术允许在空间和时间上映射高度受限的场和表面波。该信息为谐振器阵列中的频谱响应提供了宝贵的见解。这种近场显微镜和光谱方法可以研究单谐振器在THz频率下的强光-质耦合。近场技术可以在空间和时间上映射高度受限的场和面波。该信息为谐振器阵列中的频谱响应提供了宝贵的见解。这种近场显微镜和光谱方法可以研究单谐振器在THz频率下的强光-质耦合。近场技术可以在空间和时间上映射高度受限的场和面波。该信息为谐振器阵列中的频谱响应提供了宝贵的见解。这种近场显微镜和光谱方法可以研究单谐振器在THz频率下的强光-质耦合。

更新日期：2020-03-05

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