Computing systems have been facing severe technology challenges in recent years with regard to power consumption, circuit reliability, and high performance. For many years, the issues of power consumption and performance have been addressed with the use of technology scaling.However, as Dennard’s scaling tends toward an end, it has become difficult to further improve the performance under the same power constraints. In addition to power, reliability also becomes a critical issue when the feature size of the complementary metal-oxide–semiconductor (CMOS) technology is reduced below 7 nm. Thus, ensuring the complete accuracy of the signal has become increasingly challenging in recent years.

中文翻译：

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 扫描问题


近年来，计算系统在功耗、电路可靠性和高性能方面面临着严峻的技术挑战。多年来，功耗和性能问题一直通过技术缩放来解决。然而，随着Dennard缩放趋于结束，在相同功耗限制下进一步提高性能变得困难。除了功耗之外，当互补金属氧化物半导体 (CMOS) 技术的特征尺寸降至 7 nm 以下时，可靠性也成为一个关键问题。因此，确保信号的完全准确性近年来变得越来越具有挑战性。