Computing systems have been facing severe technology challenges in recent years with regard to power consumption, circuit reliability, and high performance. For many years, the issues of power consumption and performance have been addressed with the use of technology scaling.However, as Dennard’s scaling tends toward an end, it has become difficult to further improve the performance under the same power constraints. In addition to power, reliability also becomes a critical issue when the feature size of the complementary metal-oxide–semiconductor (CMOS) technology is reduced below 7 nm. Thus, ensuring the complete accuracy of the signal has become increasingly challenging in recent years.

中文翻译：

---

扫描问题

近年来，计算系统在功耗，电路可靠性和高性能方面一直面临严峻的技术挑战。多年来，功耗和性能问题已通过使用技术缩放来解决。但是，由于Dennard的缩放趋于尾声，因此在相同的功率约束下难以进一步提高性能。除了功率之外，当互补金属氧化物半导体（CMOS）技术的特征尺寸减小到7 nm以下时，可靠性也成为关键问题。因此，近年来，确保信号的完全准确性变得越来越具有挑战性。