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Preliminary study of clinical outcomes for single implant-retained mandibular overdentures.
Journal of Oral Science ( IF 1.9 ) Pub Date : 2020-01-01 , DOI: 10.2334/josnusd.19-0079
Mari Asami 1 , Manabu Kanazawa 1 , Thuy V Lam 1 , Khaing M Thu 1 , Daisuke Sato 2 , Shunsuke Minakuchi 1
Affiliation  

This study evaluated marginal bone loss and prosthetic complications associated with single implant-retained mandibular overdentures (1-IODs) with locator attachments. The 1-IOD was placed in the mandibular midline by using a conventional loading protocol in 22 patients with an edentulous mandible. Marginal bone loss at the start of loading and 12 months postoperatively was assessed by radiographic and crestal bone evaluation. The crestal bone was defined as the distance between the customized abutment shoulder and the top of the bone, as indicated by probing. In addition, implant stability quotient and prosthetic complications were recorded. The cumulative implant survival rate was 95.5%. Median implant stability quotient remained greater than 80, and median radiographic bone loss was 0.56 mm. Crestal measurement showed a median crestal bone loss of 0.16, 0.43, 0.39, and 0.52 mm on the buccal, right, lingual, and left sides, respectively. Both radiographic and crestal bone loss values significantly differed between the start of implant loading and 12 months postoperatively (except on the buccal and lingual sides; P < 0.05). The need to replace the nylon insert was the most common complication. Conventional loading of a 1-IOD with a locator attachment resulted in a high survival rate, good implant stability, and acceptable marginal bone loss.

中文翻译:

单个种植体固位的下颌覆盖义齿的临床效果的初步研究。

这项研究评估了具有定位器附件的单个种植体固位的下颌覆盖义齿(1-IOD)带来的边缘性骨丢失和修复并发症。将1-IOD通过常规加载方案放置在下颌中线中,用于22名下颌无牙的患者。负荷开始时和术后12个月的边际骨质流失均通过X线和颅骨评估来评估。牙槽骨定义为定制的基台肩部与骨头顶部之间的距离,如探测所示。另外,记录了植入物稳定性商和假体并发症。植入物的累积存活率为95.5%。中值植入物稳定性商仍大于80,中位放射照相骨丢失为0.56 mm。颅骨测量显示颊,右侧,舌侧和左侧的颅骨中位骨丢失分别为0.16、0.43、0.39和0.52 mm。在植入物开始负载和术后12个月之间,影像学和颅骨丢失值均存在显着差异(颊侧和舌侧除外; P <0.05)。最常见的并发症是需要更换尼龙插入物。传统的1-IOD与定位器附件的加载导致较高的存活率,良好的植入物稳定性和可接受的边缘性骨丢失。最常见的并发症是需要更换尼龙插入物。传统的1-IOD与定位器附件的加载导致较高的存活率,良好的植入物稳定性和可接受的边缘性骨丢失。最常见的并发症是需要更换尼龙插入物。传统的1-IOD与定位器附件的加载导致较高的存活率,良好的植入物稳定性和可接受的边缘性骨丢失。
更新日期:2020-01-01
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