当前位置: X-MOL 学术J. X-Ray Sci. Technol. › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
Spatial resolution improvement of 450 kV computed tomography via vertical subpixel detector shifting.
Journal of X-Ray Science and Technology ( IF 1.7 ) Pub Date : 2020-01-01 , DOI: 10.3233/xst-190595
Joseph Lifton 1 , Tong Liu 2
Affiliation  

X-ray sources with acceleration voltages of 450 kV typically have large focal spot sizes that lead to low spatial resolution computed tomography (CT) data. In this work a method to improve the spatial resolution of 450 kV CT is developed. The proposed method relies on using vertical subpixel detector shifting and deconvolution to generate a projection-set that has double the number of pixels in the direction parallel to the axis of rotation. The results show that the proposed method is able to increase the 10% modulation transfer function of the considered system from 3 lp/mm to 4 lp/mm. In addition, a scan of a metal additively manufactured component with periodic features of approximately 200 μm is used to demonstrate the method; small features that were not fully resolved in a conventional scan become resolvable when the proposed method is used.

中文翻译:

通过垂直子像素检测器移位提高了450 kV计算机断层摄影的空间分辨率。

加速电压为450 kV的X射线源通常具有较大的焦点尺寸,从而导致空间分辨率较低的计算机断层扫描(CT)数据。在这项工作中,开发了一种提高450 kV CT空间分辨率的方法。所提出的方法依赖于使用垂直子像素检测器移位和解卷积来生成投影集,该投影集在平行于旋转轴的方向上具有两倍的像素数。结果表明,所提出的方法能够将所考虑系统的10%调制传递函数从3 lp / mm增加到4 lp / mm。此外,扫描具有周期性特征约为200μm的金属增材制造组件可证明该方法。当使用建议的方法时,在常规扫描中无法完全解决的小特征变得可以解决。
更新日期:2020-01-22
down
wechat
bug