To precisely predict the life of optoelectronic displays over a short time, two life prediction models were established based on the three‐parameter Weibull right approximation method (TPWRAM). In Model I, the acceleration life under each stress was obtained using TPWRAM, the data points formed by acceleration life and acceleration stress were, respectively, fitted by three extrapolation functions and the optimal extrapolation function was determined by comparing the fitting determination coefficient and root‐mean‐square error. In Model II, after introducing an acceleration parameter, the luminance attenuation data under conventional stress were calculated directly by combining the ones obtained using TPWRAM under each acceleration stress. The luminance attenuation test data from the vacuum fluorescent display (VFD) were collected through four groups of constant‐stress accelerated degradation tests (ADT), and the two models were applied to the life prediction of VFD. The results indicated that the designed ADT scheme was feasible, Model I revealed the changing law of life with stress and simplified the process of life prediction, and Model II made it possible to obtain the luminance attenuation formula at conventional stress without conducting a conventional life test, overcoming the shortcomings of long time‐consuming traditional life tests. It was verified by comparing the life prediction values that the two models had very high precision, and both of these not only achieve the accurate estimation of optoelectronic product life without resorting to conventional life test, but also improved the method of life prediction and perfect its theoretical system.

中文翻译：

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无需常规寿命测试的两种光电显示器寿命预测模型。

为了在短时间内精确预测光电显示器的寿命，基于三参数威布尔右逼近法（TPWRAM）建立了两个寿命预测模型。在模型I中，使用TPWRAM获得每个应力下的加速寿命，分别通过三个外推函数拟合由加速寿命和加速应力形成的数据点，并通过比较拟合确定系数和根-确定最优外推函数均方误差。在模型II中，引入加速度参数后，通过组合在每个加速度应力下使用TPWRAM获得的亮度衰减数据，可以直接计算常规应力下的亮度衰减数据。真空荧光显示器（VFD）的亮度衰减测试数据是通过四组恒应力加速劣化测试（ADT）收集的，并将这两个模型应用于VFD的寿命预测。结果表明，所设计的ADT方案是可行的，模型I揭示了应力引起的寿命变化规律，简化了寿命预测过程，模型II使得无需进行常规寿命试验就能获得常规应力下的亮度衰减公式。克服了耗时长的传统寿命测试的缺点。通过比较寿命预测值进行了验证，这两个模型都具有很高的精度，并且这两种模型都无需借助常规寿命测试就可以实现对光电产品寿命的准确估算，