Abstract Here in, we report the mechanoluminescence (ML)from sugar crystals measured with different techniques. In case of statical loading technique, many ML pulses originate from sugar crystals and the total number of ML pulses increases linearly with increasing applied load. However, in case of impulsive excitation technique, the ML intensity increases linearly with increasing time, attains a saturation value and finally decreases with time. Semilog plot of ML intensity vs (t-tm)curve gives negative slope. The value of tm decreases with increasing impact velocity while it increases with the thickness of the sugar crystals. A linear relation between peak ML intensity and impact velocity has been observed in the present case where the total ML intensity initially increases linearly with impact velocity and gets saturated. The temperature has a negative effect on ML intensity. The ML intensity is found to decrease with increasing temperature. At the higher velocities, the decay is fast and it slows down at lower velocities. The pulse induced ML is a new and advanced technique in which when the sugar crystals are deformed, the ML pattern is similar to that as obtained during impulsive excitation with minor differences. At low impact pressures, fast and slow decays are found, while at high impact pressure only fast decay is witnessed. The ML intensity increases and is proportional to impact pressure for sugar crystals whereas the total ML intensity is found to be dependent of the volume of the sugar crystals.

中文翻译：

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用不同技术测量的糖晶体的分形机械发光

摘要 在此，我们报告了用不同技术测量的糖晶体的机械发光 (ML)。在静态加载技术的情况下，许多 ML 脉冲来自糖晶体，ML 脉冲的总数随着施加的负载的增加而线性增加。然而，在脉冲激发技术的情况下，ML 强度随着时间的增加线性增加，达到饱和值，最后随着时间的推移而减小。ML 强度与 (t-tm) 曲线的半对数图给出了负斜率。tm 值随着冲击速度的增加而减小，而随着糖晶体的厚度而增加。在目前的情况下，已观察到峰值 ML 强度和冲击速度之间的线性关系，其中总 ML 强度最初随冲击速度线性增加并变得饱和。温度对 ML 强度有负面影响。发现 ML 强度随温度升高而降低。在较高的速度下，衰减很快，而在较低的速度下会减慢。脉冲诱导 ML 是一种新的先进技术，其中当糖晶体变形时，ML 模式与脉冲激发期间获得的模式相似，但略有不同。在低冲击压力下，可以发现快速和缓慢衰减，而在高冲击压力下，只能看到快速衰减。ML 强度增加并与糖晶体的冲击压力成正比，而发现总 ML 强度取决于糖晶体的体积。衰减很快，在较低的速度下会减慢。脉冲诱导 ML 是一种新的先进技术，其中当糖晶体变形时，ML 模式与脉冲激发期间获得的模式相似，但略有不同。在低冲击压力下，可以发现快速和缓慢衰减，而在高冲击压力下，只能看到快速衰减。ML 强度增加并与糖晶体的冲击压力成正比，而发现总 ML 强度取决于糖晶体的体积。衰减很快，在较低的速度下会减慢。脉冲诱导 ML 是一种新的先进技术，其中当糖晶体变形时，ML 模式与脉冲激发期间获得的模式相似，但略有不同。在低冲击压力下，可以发现快速和缓慢衰减，而在高冲击压力下，只能看到快速衰减。ML 强度增加并与糖晶体的冲击压力成正比，而发现总 ML 强度取决于糖晶体的体积。而在高冲击压力下，只能看到快速衰减。ML 强度增加并与糖晶体的冲击压力成正比，而发现总 ML 强度取决于糖晶体的体积。而在高冲击压力下，只能看到快速衰减。ML 强度增加并与糖晶体的冲击压力成正比，而发现总 ML 强度取决于糖晶体的体积。