A new transmission electron microscopy (TEM) specimen preparation method that utilizes a combination of focused ion beam (FIB) methods and ultramicrotomy is demonstrated. This combined method retains the benefit of site-specific sampling by FIB but eliminates ion beam-induced damage except at specimen edges and allows recovery of many consecutive sections. It is best applied to porous and/or fine-grained materials that are amenable to ultramicrotomy but are located in bulk samples that are not. The method is ideal for unique samples from which every specimen is precious, and we demonstrate its utility on fine-grained material from the one-of-a-kind Paris meteorite. Compared with a specimen prepared by conventional FIB methods, the final sections are uniformly thin and free from re-deposition and curtaining artifacts common in FIB specimens prepared from porous, heterogeneous samples.

中文翻译：

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结合聚焦离子束-超薄切片法制备多孔细粒材料的 TEM 试样

演示了一种新的透射电子显微镜 (TEM) 标本制备方法，该方法结合了聚焦离子束 (FIB) 方法和超薄切片法。这种组合方法保留了 FIB 特定位置采样的优点，但消除了离子束引起的损伤，除了试样边缘，并允许恢复许多连续的部分。它最适用于适合超薄切片但位于不适合的大块样品中的多孔和/或细粒材料。该方法非常适用于每个标本都是珍贵的独特样品，我们展示了它对来自独一无二的巴黎陨石的细粒材料的实用性。与传统 FIB 方法制备的样品相比，