Iterative Logic Arrays (ILAs) are ideal as VLSI sub-systems because of their regular structure and its close resemblance with FPGAs (Field Programmable Gate Arrays). Reversible circuits are of interest in the design of very low power circuits where energy loss implied by high frequency switching is not of much consideration. Reversibility is essential for Quantum Computing. This paper examines the testability of Reversible Iterative Logic Arrays (ILAs) composed of reversible k-CNOT gates. For certain ILAs it is possible to find a test set whose size remains constant irrespective of the size of the ILA, while for others it varies with array size. Former type of ILAs is known as Constant-Testable, i.e. C-Testable. It has been shown that Reversible Logic Arrays are C-Testable and size of test set is equal to number of entries in cells truth table implying that the reversible ILAs are also Optimal-Testable, i.e. O-Testable. Uniform-Testability, i.e. U-Testability has been defined and Reversible Heterogeneous ILAs have been characterized as U-Testable. The test generation problem has been shown to be related to certain properties of cycles in a set of graphs derived from cell truth table. By careful analysis of these cycles an efficient test generation technique that can be easily converted to an ATPG program has been presented for both 1-D and 2D ILAs. The same algorithms can be easily extended for n-Dimensional Reversible ILAs.

中文翻译：

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可逆迭代逻辑数组的可测试性

迭代逻辑阵列 (ILA) 是 VLSI 子系统的理想选择，因为它们具有规则结构并且与 FPGA（现场可编程门阵列）非常相似。可逆电路在极低功率电路的设计中很受关注，其中高频开关隐含的能量损失不是很多考虑因素。可逆性对于量子计算至关重要。本文研究了由可逆 k-CNOT 门组成的可逆迭代逻辑阵列 (ILA) 的可测试性。对于某些 ILA，可以找到大小保持不变的测试集，而与 ILA 的大小无关，而对于其他 ILA，它会随数组大小而变化。前一种类型的 ILA 被称为 Constant-Testable，即 C-Testable。已经表明，可逆逻辑阵列是 C-Testable 的，并且测试集的大小等于单元真值表中的条目数，这意味着可逆 ILA 也是 Optimal-Testable，即 O-Testable。Uniform-Testability，即 U-Testability 已被定义，可逆异构 ILA 已被定性为 U-Testable。测试生成问题已被证明与从单元真值表派生的一组图中的循环的某些属性有关。通过对这些循环的仔细分析，已经为一维和二维 ILA 提供了一种可以轻松转换为 ATPG 程序的有效测试生成技术。相同的算法可以很容易地扩展到 n 维可逆 ILA。U-Testability 已被定义，可逆异构 ILA 已被定性为 U-Testable。测试生成问题已被证明与从单元真值表派生的一组图中的循环的某些属性有关。通过对这些循环的仔细分析，已经为一维和二维 ILA 提供了一种可以轻松转换为 ATPG 程序的有效测试生成技术。相同的算法可以很容易地扩展到 n 维可逆 ILA。U-Testability 已被定义，可逆异构 ILA 已被定性为 U-Testable。测试生成问题已被证明与从单元真值表派生的一组图中的循环的某些属性有关。通过对这些循环的仔细分析，已经为一维和二维 ILA 提供了一种可以轻松转换为 ATPG 程序的有效测试生成技术。相同的算法可以很容易地扩展到 n 维可逆 ILA。通过对这些循环的仔细分析，已经为一维和二维 ILA 提供了一种可以轻松转换为 ATPG 程序的有效测试生成技术。相同的算法可以很容易地扩展到 n 维可逆 ILA。通过对这些循环的仔细分析，已经为一维和二维 ILA 提供了一种可以轻松转换为 ATPG 程序的有效测试生成技术。相同的算法可以很容易地扩展到 n 维可逆 ILA。