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Effect of a Microstructured Dielectric Layer on a Bending-Insensitive Capacitive-Type Touch Sensor with Shielding
ACS Applied Electronic Materials ( IF 4.3 ) Pub Date : 2020-02-21 , DOI: 10.1021/acsaelm.0c00015
Dong-Joon Won 1 , Dongwoo Yoo 1 , Joonwon Kim 1
Affiliation  

In this paper, a design method to develop a bending-insensitive capacitive-type touch sensor is reported. To achieve bending-insensitive properties and a shielding effect to block the parasitic capacitance, the sensor is composed of a silver nanowire-based stretchable top electrode layer, a microstructured dielectric layer, and a film-type bottom electrode layer. The stretchability of the top electrode (i.e., tension or compression according to bending) and the pitch of microstructures, which affect the performance (i.e., initial value and sensitivity) of the sensor in bending situations, are analyzed using mathematical modeling and bending tests based on two perspectives. The analysis is conducted in both bending directions, that is, inward and outward, and the differences in the performance in both directions are analyzed. The fabricated sensor is capable of measuring a wide range of pressures (up to 700 kPa) with a sensitivity of ∼0.14 MPa–1. The sensor can be successfully applied to soft robotics applications.

中文翻译:

微结构介电层对弯曲不敏感的带屏蔽电容式触摸传感器的影响

在本文中,报告了一种开发不弯曲的电容式触摸传感器的设计方法。为了实现对弯曲不敏感的特性以及屏蔽寄生电容的屏蔽效果,该传感器由基于银纳米线的可拉伸顶部电极层,微结构介电层和薄膜型底部电极层组成。使用数学模型和基于弯曲的测试,分析了上电极的可拉伸性(即,根据弯曲的拉伸或压缩)和微观结构的间距,这些弯曲会影响传感器在弯曲情况下的性能(即,初始值和灵敏度)。有两个观点。在两个弯曲方向上(即向内和向外)进行分析,并分析两个方向上的性能差异。–1。该传感器可成功应用于软机器人应用。
更新日期:2020-02-21
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