Abstract X-ray diffraction (XRD) is a prominent technique to characterise cement-based materials. The combination of the Rietveld refinement with the Partial Or No Known Crystal Structure (PONKCS) approach now enables the quantification of both crystalline phases and amorphous contribution of SCMs. This paper describes the application of Rietveld-PONKCS to determine the amount of reacted glass powder (GP) in blended cement pastes. The accuracy and precision of the method were compared to the results of independent methods such as selective acid dissolution, thermogravimetric analysis (TGA) combined to energy-dispersive spectroscopy (EDS) or inductively coupled plasma (ICP) applied to GP-lime mixtures. For blended cement, the consistency of the method was internally checked using the standard addition method. Overall, an average precision of 1.6 wt% and accuracy better than 1.5 wt% were found for Rietveld-PONKCS applied to GP containing systems.

中文翻译：

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使用 Rietveld-PONKCS 方法量化混合水泥浆中的玻璃粉反应

摘要 X 射线衍射 (XRD) 是表征水泥基材料的一项重要技术。Rietveld 细化与部分或未知晶体结构 (PONKCS) 方法的结合现在可以量化 SCM 的结晶相和非晶贡献。本文介绍了 Rietveld-PONKCS 在测定混合水泥浆中反应玻璃粉 (GP) 的量方面的应用。将该方法的准确度和精密度与独立方法的结果进行比较，例如选择性酸溶解、热重分析 (TGA) 结合能量色散光谱 (EDS) 或应用于 GP-石灰混合物的电感耦合等离子体 (ICP)。对于混合水泥，使用标准添加方法内部检查方法的一致性。总体而言，平均精度为 1。