With technology scaling, lower supply voltages, and higher operating frequencies clock distribution networks become more and more vulnerable to transients faults. These faults can cause circuit-wide effects and thus, significantly contribute to the functional failure rate of the circuit. This paper proposes a methodology to analyse how the functional behaviour is affected by Single-Event Transients in the clock distribution network. The approach is based on logic-level simulation and thus, only uses the register-transfer level description of a design. Therefore, a fault model is proposed which implements the main effects due to radiation-induced transients in the clock network. This fault model enables the computation of the functional failure rate caused by Single-Event Transients for each individual clock buffer, as well as the complete network. Further, it allows the identification of the most vulnerable flip-flops related to Single-Event Transients in the clock network. The proposed methodology is applied in a practical example and a fault injection campaign is performed. In order to evaluate the impact of Single-Event Transients in clock distribution networks, the obtained functional failure rate is compared to the error rate caused by Single-Event Upsets in the sequential logic.

中文翻译：

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时钟分配网络中单事件瞬态引起的功能故障率

随着技术的扩展，更低的电源电压和更高的工作频率时钟分配网络变得越来越容易受到瞬态故障的影响。这些故障会导致整个电路的影响，从而显着增加电路的功能故障率。本文提出了一种方法来分析时钟分配网络中的单事件瞬态如何影响功能行为。该方法基于逻辑级仿真，因此仅使用设计的寄存器传输级描述。因此，提出了一个故障模型，该模型实现了时钟网络中由辐射引起的瞬态引起的主要影响。该故障模型能够为每个单独的时钟缓冲器以及整个网络计算由单事件瞬态引起的功能故障率。此外，它允许识别与时钟网络中的单事件瞬态相关的最脆弱的触发器。所提出的方法应用于实际示例并执行故障注入活动。为了评估时钟分配网络中单事件瞬态的影响，将获得的功能故障率与时序逻辑中由单事件翻转引起的错误率进行比较。