Dispersion-strengthened tungsten materials represent a new class of W-based materials to be investigated for use as plasma-facing component in nuclear fusion reactors. However, the retention and permeation characteristics of these materials under low energy deuterium (D) irradiation need to be elucidated before the efficacy of these materials can be judged. Due to possible deep penetration of D in W, depth profile techniques such as glow discharge optical emission spectroscopy (GD-OES) are needed to probe D concentrations many microns beneath the material surface. In this study, the D retention behavior of W materials containing 1–10 wt% TaC, TiC, or ZrC are investigated with GD-OES. After exposure to a 5 × 10¹⁸cm⁻² D ion fluence at 100 °C, D was observed beyond the D implantation depth the surface in many specimens, and the D depth profile was found to depend on the type and concentration of the added second phase. Combined with in-situ X-ray Photoelectron Spectroscopy (XPS) studies, the effects of impurity oxygen atoms on the D retention is considered, as an increasing oxygen content correlates with decreased D retention. The influence of grain size, second phase particles, and oxygen content on the retained D depth and concentration in these complex W-based materials is discussed.

弥散强化的钨材料代表了一种新型的W基材料，该材料将被研究用作核聚变反应堆中面向等离子体的组件。但是，在判断这些材料的功效之前，需要阐明这些材料在低能氘（D）照射下的保留和渗透特性。由于D可能会深深渗透到W中，因此需要深度分布技术（例如辉光放电光发射光谱法（GD-OES））来探测D浓度在材料表面以下的浓度。在这项研究中，使用GD-OES研究了含1-10 wt％TaC，TiC或ZrC的W材料的D保留行为。暴露于5×10 ¹⁸ cm ^-2后D离子在100°C时的能量密度，在许多样品中都观察到D超出了D注入深度，并且D深度分布取决于所添加第二相的类型和浓度。结合原位X射线光电子能谱（XPS）研究，考虑了杂质氧原子对D保留的影响，因为增加的氧含量与D保留的减少相关。讨论了晶粒尺寸，第二相颗粒和氧含量对这些复杂的W基材料中保留的D深度和浓度的影响。