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Interface engineering of two-dimensional transition metal dichalcogenides towards next-generation electronic devices: recent advances and challenges.
Nanoscale Horizons ( IF 8.0 ) Pub Date : 2020-03-04 , DOI: 10.1039/c9nh00743a
Wugang Liao 1 , Siwen Zhao , Feng Li , Cong Wang , Yanqi Ge , Huide Wang , Shibo Wang , Han Zhang
Affiliation  

Over the past decade, two-dimensional (2D) transition metal dichalcogenides (TMDCs) have attracted tremendous research interest for future electronics owing to their atomically thin thickness, compelling properties and various potential applications. However, interface engineering including contact optimization and channel modulations for 2D TMDCs represents fundamental challenges in ultimate performance of ultrathin electronics. This article provides a comprehensive overview of the basic understanding of contacts and channel engineering of 2D TMDCs and emerging electronics benefiting from these varying approaches. In particular, we elucidate multifarious contact engineering approaches such as edge contact, phase engineering and metal transfer to suppress the Fermi level pinning effect at the metal/TMDC interface, various channel treatment avenues such as van der Waals heterostructures, surface charge transfer doping to modulate the device properties, and as well the novel electronics constructed by interface engineering such as diodes, circuits and memories. Finally, we conclude this review by addressing the current challenges facing 2D TMDCs towards next-generation electronics and offering our insights into future directions of this field.

中文翻译:

面向下一代电子设备的二维过渡金属二金属卤化物的界面工程:最新进展和挑战。

在过去的十年中,由于其原子薄的厚度,引人注目的特性和各种潜在的应用,二维(2D)过渡金属二硫化碳(TMDC)引起了未来电子学的巨大研究兴趣。然而,包括2D TMDC的接触优化和通道调制在内的接口工程对超薄电子产品的最终性能提出了根本性挑战。本文全面概述了受益于这些不同方法的2D TMDC和新兴电子产品对接触和通道工程的基本了解。特别是,我们阐明了多种接触工程方法,例如边缘接触,相工程和金属转移,以抑制金属/ TMDC接口处的费米能级钉扎效应,各种通道处理方法,例如范德华(Van der Waals)异质结构,表面电荷转移掺杂以调节器件性能,以及通过接口工程构造的新型电子器件,例如二极管,电路和存储器。最后,我们通过解决2D TMDC对下一代电子产品当前面临的挑战并提供我们对该领域未来方向的见解来结束本综述。
更新日期:2020-02-06
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