An experimental strategy was developed to obtain ($$\hbox {Si}_{1-x}\hbox {Ti}_{x})\hbox {O}_{\mathrm {2}}$$ ($$x \le 0.25$$) porous materials via the sol–gel hydrothermal process. The sol was prepared from Si(OEt)$$_{\mathrm {4}}$$ (TEOS), Ti(OBu)$$_{\mathrm {4}}$$ (OBu: $$\hbox {OCH}_{\mathrm {2}}\hbox {CH}_{\mathrm {2}}\hbox {CH}_{\mathrm {2}}\hbox {CH}_{\mathrm {3}})$$, anhydrous ethanol, deionized water and nitric acid. The reagents were mixed at room temperature (293 K) to obtain a homogeneous colourless liquid which was subjected to a hydrothermal process at 473 K using a stainless steel container. Finally, the material obtained was treated at 873 K in air. The surface area of the treated solids was determined by $$\hbox {N}_{\mathrm {2}}$$ adsorption/desorption isotherms. The corresponding average pore diameter was evaluated using the Barret, Joiner and Halenda and Horvath-Kawazoe methods. Porous structures were obtained, in which the average pore diameter of the microporous ones was 1.4 nm. The characterization techniques employed were Fourier transform infrared spectroscopy (FTIR), X-ray diffraction, Raman spectroscopy, scanning electron microscopy, thermal gravimetric analysis, differential scanning calorimetry and UV–Vis diffuse reflectance spectroscopy. The Si–O–Ti bonds were detected by FTIR.

中文翻译：

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多孔 (Si$$_{1-x}$$1-xTi$$_{{x}}$$x)$$\hbox {O}_{\mathrm {{2}}}$$ 的制备和表征O2 (x $$\le $$≤ 0.25) 溶胶-凝胶水热法制备

开发了一种实验策略以获得 ($$\hbox {Si}_{1-x}\hbox {Ti}_{x})\hbox {O}_{\mathrm {2}}$$ ($$x \le 0.25$$) 多孔材料通过溶胶-凝胶水热过程。溶胶由 Si(OEt)$$_{\mathrm {4}}$$ (TEOS), Ti(OBu)$$_{\mathrm {4}}$$ (OBu: $$\hbox {OCH }_{\mathrm {2}}\hbox {CH}_{\mathrm {2}}\hbox {CH}_{\mathrm {2}}\hbox {CH}_{\mathrm {3}})$ $、无水乙醇、去离子水和硝酸。试剂在室温 (293 K) 下混合以获得均匀的无色液体，使用不锈钢容器在 473 K 下进行水热过程。最后，所得材料在空气中以 873 K 处理。处理过的固体的表面积由 $$\hbox {N}_{\mathrm {2}}$$ 吸附/解吸等温线确定。相应的平均孔径使用 Barret、Joiner 和 Halenda 以及 Horvath-Kawazoe 方法进行评估。获得多孔结构，其中微孔结构的平均孔径为1.4nm。所采用的表征技术是傅里叶变换红外光谱 (FTIR)、X 射线衍射、拉曼光谱、扫描电子显微镜、热重分析、差示扫描量热法和紫外-可见漫反射光谱。Si-O-Ti 键由 FTIR 检测。热重分析、差示扫描量热法和紫外-可见漫反射光谱。Si-O-Ti 键由 FTIR 检测。热重分析、差示扫描量热法和紫外-可见漫反射光谱。Si-O-Ti 键由 FTIR 检测。