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Correlation between Charge Transport Length Scales and Dielectric Relaxation Time Constant in Hybrid Halide Perovskite Semiconductors
ACS Energy Letters ( IF 19.3 ) Pub Date : 2020-02-12 , DOI: 10.1021/acsenergylett.0c00120 Shivam Singh 1 , Gangadhar Banappanavar 1 , Dinesh Kabra 1
ACS Energy Letters ( IF 19.3 ) Pub Date : 2020-02-12 , DOI: 10.1021/acsenergylett.0c00120 Shivam Singh 1 , Gangadhar Banappanavar 1 , Dinesh Kabra 1
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The charge carrier diffusion length and dielectric relaxations are important parameters which decide the performance of various optoelectronic devices, in particular for photovoltaic devices. A comparative study is carried out on the charge transport length scale (L) for passivated and pristine CH3NH3PbI3 (MAPI) thin-film-based perovskite solar cells (PSCs) through scanning photocurrent microscopy (SPM). The SPM study suggested an improved L and degree of ambipolarity of photogenerated charge carriers (electron and hole) in passivated as compared to pristine MAPI-based PSCs. These results were found to be correlated with frequency-dependent photocurrent measurement, which shows that the relaxation time of the charge carrier is relatively lower in passivated MAPI-based PSCs. This mechanism could be explained by trap-assisted recombination, where trap states are induced by ion migration in halide perovskite films. Furthermore, passivation of traps showed an increased degree of ambipolarity in the perovskite semiconductor thin film.
中文翻译：
混合卤化物钙钛矿半导体中电荷传输长度尺度与介电弛豫时间常数之间的相关性
电荷载流子扩散长度和介电弛豫是决定各种光电器件，特别是光伏器件的性能的重要参数。通过扫描光电流显微镜（SPM），对钝化的和原始的CH 3 NH 3 PbI 3（MAPI）薄膜钙钛矿太阳能电池（PSC）的电荷传输长度尺度（L）进行了比较研究。SPM研究表明，L与原始的基于MAPI的PSC相比，钝化后的光生电荷载流子（电子和空穴）的双极性程度。发现这些结果与频率相关的光电流测量结果相关，这表明在钝化的基于MAPI的PSC中，电荷载流子的弛豫时间相对较低。该机理可以通过陷阱辅助重组来解释，其中陷阱态是由卤化物钙钛矿薄膜中的离子迁移引起的。此外，陷阱的钝化显示出钙钛矿半导体薄膜中双极性的程度增加。
更新日期：2020-02-13
中文翻译：
混合卤化物钙钛矿半导体中电荷传输长度尺度与介电弛豫时间常数之间的相关性
电荷载流子扩散长度和介电弛豫是决定各种光电器件，特别是光伏器件的性能的重要参数。通过扫描光电流显微镜（SPM），对钝化的和原始的CH 3 NH 3 PbI 3（MAPI）薄膜钙钛矿太阳能电池（PSC）的电荷传输长度尺度（L）进行了比较研究。SPM研究表明，L与原始的基于MAPI的PSC相比，钝化后的光生电荷载流子（电子和空穴）的双极性程度。发现这些结果与频率相关的光电流测量结果相关，这表明在钝化的基于MAPI的PSC中，电荷载流子的弛豫时间相对较低。该机理可以通过陷阱辅助重组来解释，其中陷阱态是由卤化物钙钛矿薄膜中的离子迁移引起的。此外，陷阱的钝化显示出钙钛矿半导体薄膜中双极性的程度增加。
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