Lee discrepancy has wide applications in design of experiments, which can be used to measure the uniformity of fractional factorials. An improved lower bound of Lee discrepancy for asymmetrical factorials with mixed two-, three- and four-level is presented. The new lower bound is more accurate for a lot of designs than other existing lower bound, which is a useful complement to the lower bounds of Lee discrepancy and can be served as a benchmark to search uniform designs with mixed levels in terms of Lee discrepancy.

中文翻译：

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不对称阶乘的 Lee 差异的新下限

Lee差异在实验设计中具有广泛的应用，可用于测量分数阶乘的均匀性。提出了具有混合的二、三和四水平的不对称阶乘的 Lee 差异的改进下限。对于许多设计来说，新的下界比其他现有下界更准确，这是对 Lee 差异下界的有用补充，可以作为基准来搜索具有 Lee 差异的混合水平的统一设计。