Two-dimensional materials such as transition metal dichalcogenide and graphene are of great interest due to their intriguing electronic and optical properties such as metal-insulator transition based on structural variation. Accordingly, detailed analyses of structural tunability with transmission electron microscopy have become increasingly important for understanding atomic configurations. This review presents a few analyses that can be applied to two-dimensional materials using transmission electron microscopy.

中文翻译：

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通过透射电子显微镜分析二维材料的微观结构和相关性能

二维材料（如过渡金属二硫属化物和石墨烯）由于其有趣的电子和光学特性（如基于结构变化的金属-绝缘体转变）而备受关注。因此，使用透射电子显微镜对结构可调性进行详细分析对于理解原子配置变得越来越重要。这篇综述提出了一些可以使用透射电子显微镜应用于二维材料的分析。