Abstract Mg-Ag-Sb thin films were deposited by magnetron sputtering using a commercial Mg1/3Ag1/3Sb1/3 target. All the films contain principally the two phases Ag3Sb and α-MgAgSb in same proportions but exhibit different microstructures. The films have the same Seebeck coefficient despite the difference of interface density and structure. Theoretical calculations show that the film effective Seebeck coefficient Sfilm is depending only on the volume of each phase present in the film and their Seebeck coefficients. The multiple interfaces between the different phases have no effect on Sfilm.

中文翻译：

---

多相薄膜中的塞贝克系数

摘要 使用商用 Mg1/3Ag1/3Sb1/3 靶材通过磁控溅射沉积 Mg-Ag-Sb 薄膜。所有薄膜主要包含相同比例的两相 Ag3Sb 和 α-MgAgSb，但表现出不同的微观结构。尽管界面密度和结构不同，但薄膜具有相同的塞贝克系数。理论计算表明，薄膜的有效塞贝克系数 Sfilm 仅取决于薄膜中存在的每一相的体积及其塞贝克系数。不同相之间的多个界面对 Sfilm 没有影响。