Electrical transients enabled by an optical excitation and an electric detection provide a distinctive opportunity to study charge transport, recombination, and even photoelectric hysteresis of a solar cell in a wide time window ranging from nanoseconds to seconds. However, controversies on how to exploit these investigations to unravel the charge loss mechanism of the cell have been ongoing. Herein, a new methodology of quantifying the charge loss within the bulk absorber or at the interfaces and the defect properties of solar cells has been proposed. This methodology has been successfully applied in the study of commercialized silicon and emerging Cu₂ZnSn(S, Se)₄ and perovskite solar cells herein and should also be applicable to other similar photovoltaic device systems. Overall, this work provides an alluring route for a comprehensive investigation of dynamic physics processes and charge loss mechanism of solar cells and possesses potential applications for other optoelectronic devices.

通过光激发和电检测实现的电瞬变为研究太阳能电池在纳秒到秒的宽时间范围内的电荷传输，复合甚至光电滞后提供了独特的机会。然而，关于如何利用这些研究来揭示电池电荷损失机制的争论一直在进行。在此，已经提出了一种新的方法，该方法用于量化体吸收器内或界面处的电荷损耗以及太阳能电池的缺陷特性。该方法已成功应用于商业化硅和新兴的Cu ₂ ZnSn（S，Se）_{4的研究中}钙钛矿和钙钛矿太阳能电池，也应适用于其他类似的光伏设备系统。总的来说，这项工作为全面研究太阳能电池的动态物理过程和电荷损失机理提供了诱人的途径，并在其他光电器件中具有潜在的应用。