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Inversion method of the key structure parameters of light screen array measurement system using genetic algorithm
Optik Pub Date : 2020-01-27 , DOI: 10.1016/j.ijleo.2019.164064
Rui Chen , Ding Chen , Bowen Ji , Jinping Ni

To effectively improve the measurement accuracy of the light screen array measurement system (LSA for short) in the evaluation of continuous rapid-firing weapon, the paper presents an inversion method to obtain the key structure parameters of LSA based on genetic algorithm. First, we systematically introduce a measurement model based on the key structure parameters of the LSA. Second, we establish an objective function through the validation of the measurement results. Next, an inversion method is derived to generate many groups of structural parameters within the allowable error range. Finally, we can adopt a genetic algorithm to obtain a group of the key structural parameters which are the closest to their truth value. Through simulations and experiments, results show that the measurement model is corrected because of the key structural parameters through the inversion, and thus the accuracy of the LSA is effectively improved.



中文翻译:

基于遗传算法的光幕阵列测量系统关键结构参数反演方法

为了有效提高光幕阵列测量系统(简称LSA)在连续快速射击武器评估中的测量精度,提出了一种基于遗传算法的反求LSA关键结构参数的方法。首先,我们基于LSA的关键结构参数系统地介绍一种测量模型。其次,我们通过验证测量结果来建立目标函数。接下来,推导一种反演方法,以在允许误差范围内生成许多结构参数组。最后,我们可以采用遗传算法来获得一组最接近其真实值的关键结构参数。通过模拟和实验,

更新日期:2020-01-27
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