Abstract This study proposes an optical methodology to measure the deflection radius of flexible polymeric substrates; to our best knowledge, this is the first report taking into consideration the optical anisotropy effect of these substrates for such measurements. The relation between the deflection-induced optical phase retardation of two distinct refraction beams and the deflection radius was derived. Full-field phase maps were obtained via a polarization measurement system and the phase-stepping technique. The measurement results for three substrates having nominal deflection radii of 50, 55, and 60 mm were, correspondingly, 51.39 ± 0.37, 57.56 ± 1.00, and 58.71 ± 0.85 mm (error = 2.78%, 4.65%, and 2.15%, respectively); thus, the measurement precision was confirmed.

中文翻译：

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用于测量光学各向异性柔性聚合物基板的偏转半径的光偏振测量

摘要 本研究提出了一种光学方法来测量柔性聚合物基板的偏转半径；据我们所知，这是第一份考虑到这些基板对此类测量的光学各向异性效应的报告。导出了两个不同折射光束的偏转引起的光学相位延迟与偏转半径之间的关系。全场相位图是通过极化测量系统和相位步进技术获得的。标称偏转半径为 50、55 和 60 mm 的三种基板的测量结果分别为 51.39 ± 0.37、57.56 ± 1.00 和 58.71 ± 0.85 mm（误差 = 2.78%、4.65% 和 2.15%） ; 因此，确认了测量精度。