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High-speed phase-shifting profilometry under fluorescent light
Optics and Lasers in Engineering ( IF 3.5 ) Pub Date : 2020-05-01 , DOI: 10.1016/j.optlaseng.2020.106033
Dongliang Zheng , Qian Kemao , Jing Han , Jing Wang , Haotian Yu , Lianfa Bai

Abstract Phase-shifting profilometry (PSP) has been widely used in three-dimensional (3-D) shape measurement because of its attributes of high-accuracy and high-resolution. However, PSP typically works under fluorescent light, flickering with a double frequency of the alternating current frequency, which may generate a non-ignorable phase error, and result in a PSP's measurement error, especially for PSP using a high sampling speed. We first mathematically describe the fluorescent light problem, model the PSP's phase error, and state the problem in high-speed PSP. Next, a fluorescent light error suppression (FLES) algorithm is proposed to suppress the phase error. Both the phase error model and the proposed algorithm are theoretically analyzed, and then numerically and experimentally verified. The provided numerical and experimental results coincide with the theoretical analysis. The proposed algorithm can reduce the phase error from 0.12 rad to a comparable level with system noise of 0.02 rad, which is significant for the accurate measurement of 3-D shapes for high-speed PSP in a fluorescent light environment.

中文翻译:

荧光灯下的高速相移轮廓测量法

摘要 相移轮廓仪(PSP)因其高精度和高分辨率的特性而被广泛应用于三维(3-D)形状测量。但PSP一般工作在荧光灯下,闪烁频率为交流频率的两倍,可能会产生不可忽视的相位误差,导致PSP的测量误差,尤其是对于采样速度较高的PSP。我们首先用数学方法描述荧光灯问题,模拟 PSP 的相位误差,并在高速 PSP 中陈述问题。接下来,提出了一种荧光误差抑制(FLES)算法来抑制相位误差。对相位误差模型和所提出的算法进行了理论分析,然后进行了数值和实验验证。提供的数值和实验结果与理论分析一致。所提出的算法可以将相位误差从 0.12 rad 降低到与系统噪声 0.02 rad 相当的水平,这对于在荧光灯环境中准确测量高速 PSP 的 3-D 形状具有重要意义。
更新日期:2020-05-01
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