Due to the subtle structure, the exact geometry parameters of the focused plenoptic camera cannot be retrieved after packaging, which leads to inaccurate light field processing such as visible artifacts in the rendering images. This paper proposes a novel blind calibration method to calculate the geometry parameters for the focused plenoptic cameras with high precision. It translates the problem of deriving the value of the geometry parameters to be the problem of deriving the pixel patch-size of each micro-image used in subaperture image rendering based on the geometry projection of the relay imaging process in the focused plenoptic camera. Then, a dark image calibration algorithm is proposed to retrieve the position and the geometry parameters of the MLA for subaperture image rendering. A triple-level calibration board with random texture is designed to realize focus plane confirming blindly, to facilitate capturing light field images at different object distances via a single shot and to benefit intensity feature matching in determining the rendering patch size. The rendering patch-size is found by the proposed Gradient-SSIM-based fractional-pixel matching based on the geometry projection analysis. Experiments conducted on the simulated data and the real imaging system demonstrate that the proposed method can acquire the geometry parameters with high accuracy and is robust to different focused plenoptic cameras.

中文翻译：

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聚焦全光摄像机的几何参数校准。

由于其微妙的结构，包装后无法检索聚焦全光摄像机的确切几何参数，这会导致光场处理不准确，例如渲染图像中的可见伪像。本文提出了一种新颖的盲标定方法，可以高精度地计算聚焦全光相机的几何参数。它将几何参数的值导出为基于聚焦全光相机中的中继成像过程的几何投影来导出子孔径图像渲染中使用的每个微图像的像素补丁大小的问题。然后，提出了一种暗图像校准算法，以检索用于子孔径图像渲染的MLA的位置和几何参数。设计具有随机纹理的三级校准板，以实现盲目确认的聚焦平面，从而有助于通过单次拍摄在不同物距下捕获光场图像，并有利于强度特征匹配，从而确定渲染斑块的大小。通过基于几何投影分析的基于梯度SSIM的分数像素匹配，可以找到渲染补丁的大小。在模拟数据和真实成像系统上进行的实验表明，该方法可以高精度地获取几何参数，并且对不同聚焦的全光相机具有鲁棒性。通过基于几何投影分析的基于梯度SSIM的分数像素匹配，可以找到渲染补丁的大小。在模拟数据和真实成像系统上进行的实验表明，该方法可以高精度地获取几何参数，并且对不同聚焦的全光相机具有鲁棒性。通过基于几何投影分析的基于梯度SSIM的分数像素匹配，可以找到渲染补丁的大小。在模拟数据和真实成像系统上进行的实验表明，该方法可以高精度地获取几何参数，并且对不同聚焦的全光相机具有鲁棒性。