Abstract Different quantity of aluminium (Al) doped CdS thin films are fabricated through a facile and cost-effective spray pyrolysis route. Elemental composition and mapping studies approved the presence of Al and its homogeneous distribution throughout the films. The surface morphology of films is found to be modified by Al doping content. X-ray diffraction studies show that the grown films are of hexagonal crystal system. The crystallite size was estimated in range from 16 to 22 nm. Lattice parameters were determined using POWDERX software and confirm single phase of CdS. Vibrational study possesses fundamental phonon modes in all fabricated films related to single hexagonal phase of CdS. Optical study confirms that the films are low absorbing and high transparency. The estimated values of refractive indices are noticed in the range of 1–2.8. Real and imaginary parts of permittivity and loss tangent values were calculated. Furthermore, the linear susceptibility, nonlinear cubic susceptibility, and refractive index were obtained using z-scan technique and observed to be enhanced from 1.17 × 10−6 to 4.66 × 10−6 cmW−1, 3.68 × 10−5 to 6.93 × 10−5 esu. and 2.89 × 10−8 to 5.11 × 10−8 cm2W−1, respectively.

中文翻译：

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Al:CdS 薄膜的简单喷雾热解制造及其关键的线性和三阶非线性光学分析用于光电应用

摘要 通过简便且经济高效的喷雾热解途径制备了不同数量的铝 (Al) 掺杂的 CdS 薄膜。元素组成和映射研究证实了铝的存在及其在整个薄膜中的均匀分布。发现薄膜的表面形貌受铝掺杂量的影响。X 射线衍射研究表明，生长的薄膜是六方晶系。微晶尺寸估计在 16 到 22 nm 的范围内。使用 POWDERX 软件确定晶格参数并确认单相 CdS。振动研究在与 CdS 的单一六方相相关的所有制造薄膜中都具有基本声子模式。光学研究证实该薄膜具有低吸收性和高透明度。折射率的估计值在 1-2.8 的范围内被注意到。计算了介电常数和损耗角正切值的实部和虚部。此外，使用 z 扫描技术获得线性磁化率、非线性三次磁化率和折射率，观察到从 1.17 × 10−6 增强到 4.66 × 10−6 cmW−1、3.68 × 10−5 到 6.93 × 10 −5 esu。和 2.89 × 10−8 至 5.11 × 10−8 cm2W−1。