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In Twisting Motion, Stress‐Free Zone of Wearable Electronics
Advanced Electronic Materials ( IF 5.3 ) Pub Date : 2020-01-22 , DOI: 10.1002/aelm.201901239
Yong‐Wook Kwon 1 , Jong‐Sung Lee 2 , Young‐Chang Joo 2 , Byoung‐Joon Kim 1
Affiliation  

Flexible electronics, such as flexible displays, batteries, and sensors, are under active development, and their mechanical reliability under repeated mechanical deformations is receiving a lot of attention. The mechanical stress under simple bending has been widely investigated, and the neutral plane located tensile and compressive region has been suggested for stress‐free zone under bending. However, to develop highly reliable twistable electronics, it is essential to elucidate the stress evolution during complex twisting deformation, and determine the stress‐free zone in twisting. The mechanical reliability of flexible indium tin oxide and Cu patterns during repeated twisting motions is reported. For fixed twisting, the patterns at the center show higher stability, but for free twisting, the patterns at the edge exhibit superior mechanical reliability. The mechanical stress evolution in twisting motion is analyzed by finite element method simulation, and the stress‐free zone according to twisting motion and base is proposed. Finally, the stress‐free zone is verified by conducting real twisting tests, such as the twisting motion of the human body. This study based on experimental reliability testing and computational simulation can provide guidelines to develop highly reliable twisting electronics.

中文翻译:

在扭曲运动中,可穿戴电子设备的无应力区域

柔性电子设备,例如柔性显示器,电池和传感器,正在积极开发中,并且在反复的机械变形下其机械可靠性受到了广泛的关注。对简单弯曲下的机械应力进行了广泛的研究,对于弯曲下的无应力区,建议在中性面位于拉伸和压缩区域。但是,要开发高度可靠的可扭曲电子产品,必须弄清复杂的扭曲变形过程中的应力演变,并确定扭曲时的无应力区域。据报道,在反复扭转运动期间,柔性铟锡氧化物和铜图案的机械可靠性。对于固定扭曲,位于中心的花样显示出更高的稳定性,但对于自由扭曲,边缘的图案表现出卓越的机械可靠性。通过有限元方法仿真分析了扭转运动中的机械应力演化,并提出了根据扭转运动和基础的无应力区。最后,通过进行真实的扭曲测试(例如人体的扭曲运动)来验证无应力区域。这项基于实验可靠性测试和计算仿真的研究可以为开发高度可靠的扭曲电子产品提供指导。
更新日期:2020-03-09
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