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Enhanced piezoelectric tactile sensing behaviors of high-density and low-damage CF4-plasma-treated IGZO thin-film transistors coated by P(VDF-TrFE) copolymers
Sensors and Actuators A: Physical ( IF 4.1 ) Pub Date : 2020-01-22 , DOI: 10.1016/j.sna.2020.111855
Jer-Chyi Wang , Yi-Pei Jiang , Chi-Hung Lin , Shun-Hsiang Chan , Ming-Chung Wu

Piezoelectric pressure sensing behaviors of high-density and low-damage CF4-plasma-treated indium gallium zinc oxide (IGZO) thin-film transistors (TFTs) coated by poly(vinylidene fluoride-co-trifluoroethylene) (P(VDF-TrFE)) films have been investigated. The CF4 plasma treatment was performed on the IGZO channel by using an inductively coupled plasma (ICP) system with a quartz filter. Prior to the fabrication of devices, X-ray diffractometer (XRD) and atomic force microscopy (AFM) were applied to identify the enhancement in the crystallinity of P(VDF-TrFE) films on the plasma-fluorinated IGZO films. With the analyses of X-ray photoelectron spectroscopy (XPS), it is proved that the fluorine radicals reacted with the metal-oxygen bonds will increase the oxygen vacancies in IGZO films, contributing to an enhancement in field effect mobility (μFE) and drain current (IDS) of IGZO TFTs. Furthermore, the fluorine atoms diffused from the IGZO channel into the bottom SiO2 layer were confirmed by secondary ion-mass spectroscopy (SIMS), reducing the interfacial and oxide charges of the devices for a negative shift in threshold voltage (Vt). Under a 0.5-kg applied force press/release cyclic test, a 4.8-fold increase in drain current response of 1-min CF4-plasma-treated piezoelectric pressure sensors was optimized, because of the enhanced electrical behaviors of IGZO TFTs and an increase in aligned dipole moments of P(VDF-TrFE) copolymers. The promising results make the piezoelectric pressure sensors with high-density and low-damage CF4-plasma-treated IGZO TFTs coated by P(VDF-TrFE) copolymer suitable for future high-performance tactile sensing applications.



中文翻译:

P(VDF-TrFE)共聚物涂覆的高密度和低损伤CF 4等离子体处理的IGZO薄膜晶体管的增强的压电触觉感应行为

高密度和低损伤CF 4等离子体处理的聚偏二氟乙烯-三氟乙烯-三氟乙烯共膜的铟镓锌氧化物(IGZO)薄膜晶体管(TFT)的压电压力传感行为)的电影已经过调查。CF 4通过使用带有石英滤光片的电感耦合等离子体(ICP)系统对IGZO通道进行等离子体处理。在制造器件之前,先应用X射线衍射仪(XRD)和原子力显微镜(AFM)来确定等离子体氟化IGZO膜上P(VDF-TrFE)膜的结晶度提高。通过X射线光电子能谱(XPS)的分析,证明与金属-氧键反应的氟自由基会增加IGZO膜中的氧空位,从而有助于提高场效应迁移率(μFE)和漏极IGZO TFT的电流(I DS)。此外,氟原子从IGZO通道扩散到底部SiO 2中通过二次离子质谱(SIMS)确认了硅层的厚度,从而降低了器件的界面电荷和氧化物电荷,从而使阈值电压(V t)发生负向偏移。在0.5千克外加压力按压/释放循环测试下,由于IGZO TFT的增强的电学行为和增加的电流,经过1分钟CF 4等离子处理的压电压力传感器的漏极电流响应提高了4.8倍,P(VDF-TrFE)共聚物的排列偶极矩 令人鼓舞的结果使压电压力传感器具有由P(VDF-TrFE)共聚物涂覆的高密度,低损伤CF 4等离子体处理的IGZO TFT,适合未来的高性能触觉传感应用。

更新日期:2020-01-22
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