The fluorescence vibrational features of as-synthesized P3HT–ZnO:\(\hbox {Ho}^{3+}\) and P3HT–ZnO:\(\hbox {Tm}^{3+}\) thin films were investigated using Gaussian analysis. Relative to P3HT–ZnO:\(\hbox {Tm}^{3+}\) film, detailed Gaussian analysis of the fluorescence spectra revealed weaker intensity exhibited in P3HT–ZnO:\(\hbox {Ho}^{3+}\) film due to better charge transfer. Moreover, we comparatively present the Huang–Rhys factor and relaxation energy of the samples, which are calculated using relations derived from the Franck–Condon theory. Furthermore, P3HT–ZnO:\(\hbox {Ho}^{3+}\) film exhibits lower relaxation energy as compared with P3HT–ZnO:\(\hbox {Tm}^{3+}\) film, which implies better conjugation length. Finally, the singlet exciton lifetime of P3HT–ZnO:\(\hbox {Ho}^{3+}\) sample was found to be shorter as compared with P3HT–ZnO:\(\hbox {Tm}^{3+}\), while the calculated exciton diffusion length was 6.4 and 10.3 nm, respectively.

中文翻译：

---

P3HT 衍生的 $$\hbox {Ho}^{3+}$$Ho3+- 和 $$\hbox {Tm}^{3+}$$Tm3+ 掺杂的 ZnO 纳米结构的时间分辨荧光衰减和高斯分析

使用合成的 P3HT–ZnO:\(\hbox {Ho}^{3+}\) 和 P3HT–ZnO:\(\hbox {Tm}^{3+}\) 薄膜的荧光振动特征进行研究高斯分析。相对于 P3HT–ZnO:\(\hbox {Tm}^{3+}\) 膜，荧光光谱的详细高斯分析显示 P3HT–ZnO 中表现出较弱的强度：\(\hbox {Ho}^{3+} \) 薄膜由于更好的电荷转移。此外，我们比较地呈现了样品的 Huang-Rhys 因子和弛豫能，它们是使用源自 Franck-Condon 理论的关系计算的。此外，P3HT–ZnO:\(\hbox {Ho}^{3+}\) 薄膜与 P3HT–ZnO:\(\hbox {Tm}^{3+}\) 薄膜相比表现出更低的弛豫能，这意味着更好的共轭长度。最后，发现 P3HT–ZnO:\(\hbox {Ho}^{3+}\) 样品的单线态激子寿命比 P3HT–ZnO 更短：