Abstract Zeolitic imidazolate frameworks (ZIF-8) thin films were fabricated via layer by a layer deposition method. The investigation of X-ray diffraction (XRD) of the ZIF-8 powder form was seen to be polycrystalline with a single cubic-phase structure. The lattice parameters and Miller index were calculated using Rietveld refinement by Fullprof software. XRD of ZIF-8 film demonstrates an amorphous structure. The morphology of the ZIF-8 films has therefore been studied with the scanning laser microscope method and found that the homogeneity and surface enhance with increasing the film thickness. On the other hand, it is found that ZIF-8 films have a direct electronic transition with two energy bandgaps (3.62 and 4.58 eV) and their values independent of the thickness of the films. The optical constants were calculated, and the refractive index esteems increment with expanding of the film thickness. This outcome might be credited to the interlude of the film in the preliminary phase of the deposition. The nonlinear optical constants for ZIF-8 film were calculated, and the third-order optical nonlinearity was expanded with expanding the film thickness.

中文翻译：

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用于固态电子应用的沸石咪唑酯骨架 (ZIF-8) 的结构表征和光学性质

摘要 采用层积法制备了沸石咪唑酯骨架（ZIF-8）薄膜。ZIF-8 粉末形式的 X 射线衍射 (XRD) 研究表明，它是具有单立方相结构的多晶。晶格参数和米勒指数通过 Fullprof 软件使用 Rietveld 细化计算。ZIF-8 薄膜的 XRD 显示出无定形结构。因此，用扫描激光显微镜方法研究了 ZIF-8 薄膜的形态，发现随着薄膜厚度的增加，均匀性和表面增强。另一方面，发现 ZIF-8 薄膜具有两个能带隙（3.62 和 4.58 eV）的直接电子跃迁，它们的值与薄膜的厚度无关。计算出光学常数，并且折射率随着膜厚的扩大而增加。这一结果可能归功于薄膜在沉积的初步阶段的插曲。计算了ZIF-8薄膜的非线性光学常数，随着薄膜厚度的增加，三阶光学非线性扩展。