Thin Polymer Film Force Spectroscopy: Single Chain Pull-out and Desorption,ACS Macro Letters

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Thin Polymer Film Force Spectroscopy: Single Chain Pull-out and Desorption
ACS Macro Letters ( IF 5.1 ) Pub Date : 2020-01-14 , DOI: 10.1021/acsmacrolett.9b00894
Jake McClements ₁ , Vasileios Koutsos ₁

Affiliation

Atomic force microscopy (AFM) was utilized to investigate the force associated with chain pull-out and single chain desorption of poly(styrene-co-butadiene) random copolymer thin films on mica, silicon, and graphite substrates. Chain pull-out events were common and produced a force of 20–25 pN. The polymer desorption force was strongest on the graphite substrate and weakest on the mica, which agreed with the calculated work of adhesion for each system and the substrate hydrophobicity. Furthermore, it was demonstrated that there was a systematic order to when each of these phenomena occurred during the tip retraction from the surface, which provided information about the structure of the thin films.

中文翻译：

聚合物薄膜力谱：单链拉出和解吸

原子力显微镜（AFM）用于研究与聚（苯乙烯-共-丁二烯）无规共聚物薄膜在云母、硅和石墨基材上的链拉出和单链解吸相关的力。链条拉出事件很常见，并产生 20-25 pN 的力。聚合物解吸力在石墨基材上最强，在云母上最弱，这与计算得出的每个系统的粘附功和基材疏水性一致。此外，证明了在尖端从表面缩回期间发生这些现象中的每一个的时间存在系统顺序，这提供了有关薄膜结构的信息。

更新日期：2020-01-14

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