Abstract Well-designed archaeometric studies can provide pertinent information on ancient ceramic production technologies and allow better understanding of their manufacturing methods. In this regard, fine and glazed ceramics constitute a particularly interesting class of archeological artefacts, with increasing scientific interest for their production and functional aspects. In the present work we analyzed a selection of Attic and western-Greek black-glazed vessels from two archaeological excavations in Gela (Sicily, Italy), currently held at the Gela Archaeological Museum. The goal of the present study was to shed light on the archeological questions concerning the discrimination among western-Greek colonial workshops and the possible identification of different manufacture technologies throughout the colonies. Synchrotron µ-X-Ray fluorescence (µ-XRF) imaging and µ-X-Ray absorption near edge spectroscopy (µ-XANES) were performed at the newly opened PUMA beamline of the SOLEIL Synchrotron Radiation Facility. Using µ-XRF and µ-XANES we evaluated possible elemental variations in the glaze and their Fe-speciation, which can provide chemical and mineralogical markers for provenance identification. µ-XRF mapping of cross-sections spanning from the glaze to the body of each sample highlighted a variety of black-glaze compositions, including those characterized by high levels of Zn, which may be used as technological marker. Overall, our results provide chemically based criteria for the discrimination of Attic and western-Greek black-glazed colonial products and highlight distinguishing technological features among western-Greek workshops in Sicily and South-Italy.

中文翻译：

---

nSynchrotron µ-XRF 成像和 µ-XANES 在 PUMA 光束线上的黑色釉面制品：对殖民生产技术标记的见解

摘要 精心设计的考古学研究可以提供有关古代陶瓷生产技术的相关信息，并有助于更好地了解其制造方法。在这方面，精美的釉面陶瓷构成了一类特别有趣的考古文物，其生产和功能方面的科学兴趣日益浓厚。在目前的工作中，我们分析了从 Gela（意大利西西里岛）的两次考古发掘中挑选出的阁楼和希腊西部黑色釉面器皿，目前保存在 Gela 考古博物馆。本研究的目的是阐明有关西希腊殖民工场之间的歧视以及整个殖民地不同制造技术的可能识别的考古问题。同步加速器 µ-X 射线荧光 (µ-XRF) 成像和 µ-X 射线吸收近边缘光谱 (µ-XANES) 在 SOLEIL 同步加速器辐射设施新开放的 PUMA 光束线上进行。我们使用 µ-XRF 和 µ-XANES 评估了釉料中可能的元素变化及其 Fe 形态，这可以为来源识别提供化学和矿物学标记。从每个样品的釉料到主体的横截面的 µ-XRF 映射突出显示了各种黑釉成分，包括以高含量 Zn 为特征的成分，这些成分可用作技术标记。全面的，