当前位置: X-MOL 学术Appl. Surf. Sci. › 论文详情
Surface optical characterization at nanoscale using phasor representation of data acquired by scattering scanning near-field optical microscopy
Applied Surface Science ( IF 5.155 ) Pub Date : 2020-01-12 , DOI: 10.1016/j.apsusc.2020.145347
Denis E. Tranca; Stefan G. Stanciu; Radu Hristu; Loredana Latterini; George A. Stanciu

Placed at the junction of laser-scanning and probe-scanning techniques, scattering scanning near-field optical microscopy (s-SNOM) is a promising tool for the optical investigation of surfaces at nanoscale resolution. In this work we expand the current possibilities of representing s-SNOM data by coupling typical s-SNOM results (amplitude and phase images) with the phasor representation method, an extremely powerful tool for complex data analysis. Our results demonstrate that representing s-SNOM data in the phasor space can be very useful for surface characterization of different types of materials and can be successfully used for differentiating different materials types (or different species of the same type). Phasor representation of s-SNOM data proves thus to be a reliable tool for nanoscale optical investigations of surfaces, and its widespread could potentially bring significant added value in applications where identifying and understanding the physicochemical properties of advanced materials and biological samples at nanoscale is important.
更新日期:2020-01-13

 

全部期刊列表>>
Springer Nature 2019高下载量文章和章节
化学/材料学中国作者研究精选
《科学报告》最新环境科学研究
ACS材料视界
自然科研论文编辑服务
中南大学国家杰青杨华明
剑桥大学-
中南大学
材料化学和生物传感方向博士后招聘
课题组网站
X-MOL
北京大学分子工程苏南研究院
华东师范大学分子机器及功能材料
中山大学化学工程与技术学院
试剂库存
天合科研
down
wechat
bug