Abstract Placed at the junction of laser-scanning and probe-scanning techniques, scattering scanning near-field optical microscopy (s-SNOM) is a promising tool for the optical investigation of surfaces at nanoscale resolution. In this work we expand the current possibilities of representing s-SNOM data by coupling typical s-SNOM results (amplitude and phase images) with the phasor representation method, an extremely powerful approach for complex data analysis. Our results demonstrate that representing s-SNOM data in the phasor space can be very useful for surface characterization of different types of materials and can be successfully used for distinguishing distinct materials (or distinct species of the same material). Phasor representation of s-SNOM data proves thus to augment this technique's potential for optically investigating surfaces at nanoscale. In our opnnion, thewidespread of such approaches could bring significant added value in applications where identifying and understanding the physicochemical properties of advanced materials and biological samples at nanoscale is important.

中文翻译：

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使用散射扫描近场光学显微镜获得的数据的相量表示在纳米尺度上的表面光学表征

摘要 散射扫描近场光学显微镜 (s-SNOM) 位于激光扫描和探针扫描技术的结合处，是一种很有前途的工具，可用于以纳米级分辨率对表面进行光学研究。在这项工作中，我们通过将典型的 s-SNOM 结果（幅度和相位图像）与相量表示方法（一种非常强大的复杂数据分析方法）相结合，扩展了表示 s-SNOM 数据的当前可能性。我们的结果表明，在相量空间中表示 s-SNOM 数据对于不同类型材料的表面表征非常有用，并且可以成功地用于区分不同的材料（或相同材料的不同种类）。s-SNOM 数据的相量表示因此证明可以增强这种技术' 在纳米尺度上对表面进行光学研究的潜力。在我们看来，这种方法的广泛应用可以为在纳米尺度上识别和理解先进材料和生物样品的物理化学特性很重要的应用带来显着的附加价值。