In this article, the scan blindness in a T-printed dipole is analyzed, and an elimination strategy is proposed. First, the main cause of scan blindness is analyzed. The scan characteristics are obtained using an active element pattern (AEP) with an infinite rectangular lattice arrangement. Based on the propagation of a guided wave along the antenna row and the electric-field ( $E$ -field) distribution observed during simulations, an equivalent circuit model for a unit cell of the T-printed dipole is obtained. A quasi-transverse electromagnetic (TEM) guided wave is predicted using the dispersion relation curve obtained from the equivalent circuit, and it is proven that the calculated curve is in good agreement with the eigen mode simulations and measured trajectory of the scan blind angle, for different frequencies. Next, slits and stubs are introduced as parasitic structures to eliminate the scan blindness and improve the antenna scan range. To confirm the effects of these parasitic elements, a linear array simulation is performed, which confirms the suppression of a quasi-TEM guided wave. Analysis of the active reflection coefficient and dispersion diagram indicates that the scan characteristics have been improved by the addition of parasitics. Four types of array prototypes are fabricated and their measurements validate the scan blindness prediction and confirm the proposed mechanism of scan blindness and its improvements.

中文翻译：

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T型打印偶极子阵列扫描盲区的机理及消除

本文分析了T-printed偶极子的扫描盲区，并提出了消除策略。首先分析造成扫描失明的主要原因。使用具有无限矩形晶格排列的有源元件图案 (AEP) 获得扫描特性。基于导波沿天线行的传播和在仿真过程中观察到的电场 ($E$ -field) 分布，获得了 T 印刷偶极子单元的等效电路模型。利用等效电路得到的色散关系曲线预测准横向电磁（TEM）导波，证明计算曲线与本征模式模拟和扫描死角的实测轨迹吻合良好，为不同的频率。下一个，狭缝和短截线作为寄生结构引入，以消除扫描盲区并提高天线扫描范围。为了确认这些寄生元件的影响，进行了线性阵列模拟，这证实了准 TEM 导波的抑制。对主动反射系数和色散图的分析表明，通过添加寄生参数，扫描特性得到了改善。制造了四种类型的阵列原型，它们的测量验证了扫描失明预测，并确认了所提出的扫描失明机制及其改进。这证实了准 TEM 导波的抑制。对主动反射系数和色散图的分析表明，通过添加寄生参数，扫描特性得到了改善。制造了四种类型的阵列原型，它们的测量验证了扫描失明预测，并确认了所提出的扫描失明机制及其改进。这证实了准 TEM 导波的抑制。对主动反射系数和色散图的分析表明，通过添加寄生参数，扫描特性得到了改善。制造了四种类型的阵列原型，它们的测量验证了扫描失明预测，并确认了所提出的扫描失明机制及其改进。